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Full-Text Articles in Engineering

United States Patent: Ellipsometer, John A. Woollam, Blaine D. Johs, David W. Doerr, Reed A. Christenson Dec 1994

United States Patent: Ellipsometer, John A. Woollam, Blaine D. Johs, David W. Doerr, Reed A. Christenson

Department of Electrical and Computer Engineering: Faculty Publications

To sense characteristics of a sample, an ellipsometer includes a pivotal diffraction grating positioned to receive white light from the analyzer without further focusing of the light after the light leaves the sample. The diffraction grating is focused on the sensor at a predetermined angle with a precision of at least plus or minus one-half degree using an alignment-sensing means positioned between the analyzer and diffraction grating. The sensor includes an aperture through which the incident beam of light is transmitted, light-sensitive areas on opposite sides of said sensor and a comparator for comparing the signal from said light-sensitive areas. …


Complex Index-Of-Refraction Measurements For Rp-1 Liquid Rocket Fuel, Dennis R. Alexander, Ramu Kaiwala, Robert D. Kubik, Scott A. Schaub Sep 1994

Complex Index-Of-Refraction Measurements For Rp-1 Liquid Rocket Fuel, Dennis R. Alexander, Ramu Kaiwala, Robert D. Kubik, Scott A. Schaub

Department of Electrical and Computer Engineering: Faculty Publications

Complex index-of-refraction values of RP-1 liquid rocket fuel are reported at laser wavelengths of 0.193 m (ArF excimer), 0.4765 m (argon ion), 0.488 im (argon ion), 0.5145 ji.m (argon ion), 0.532 m (Nd-YAG, frequency doubled), 0.6328 pm (He-Ne), 1 .064 im (Nd-YAG), and 10.5915 im (C02). The imaginary part of the index of refraction (k) is determined by traditional transmission methods. The real part (flr) at the specific laser lines is determined using reflectance measurements, critical-angle measurements, Mueller matrix elements, and Michelson interferometric measurements. Reflectance measurements are used to obtam n at a wavelength of 0.193 m. The critical-angle method …


Constraint Objects, Divesh Srivastava, Raghu Ramakrishnan, Peter Revesz May 1994

Constraint Objects, Divesh Srivastava, Raghu Ramakrishnan, Peter Revesz

CSE Conference and Workshop Papers

We describe the Constraint Object Data Model (CODM), which enhances an object-based data model with existential constraints to naturally represent partially specified information. We present the Constraint Object Query Language (COQL), a declarative, rule-based query language that can be used to infer relationships about and monotonically refine information represented in the CODM. COQL has a model-theoretic and an equivalent fixed-point semantics, based on the notions of constraint entailment and "proofs in all possible worlds." We also provide a novel polynomial-time algorithm for quantifier elimination for set-order constraints, a restricted class of set constraints that uses membership of subset-equal.


Interferometric Determination Of The Quadratic Electro-Optic Coefficient Of Nitrobenzene, Harshad P. Sardesai, William C. Nunnally, P. F. Williams Apr 1994

Interferometric Determination Of The Quadratic Electro-Optic Coefficient Of Nitrobenzene, Harshad P. Sardesai, William C. Nunnally, P. F. Williams

P. F. (Paul Frazer) Williams Publications

An interferometric method that was used to measure the electro-optic s11 coefficient of nitrobenzene is presented. The method uses a Mach-Zehnder interferometer arrangement that produces a finite fringe interferogram. A nitrobenzene Kerr cell is placed in one arm of the interferometer and a pulsed high voltage is applied to the two rectangular electrodes. The voltage application causes the fringe image to shift in time, and this fringe shift is measured by a streak camera that streaks the fringe image across a slit. The streak start time is chosen before the application of the voltage pulse and ends after the …


Field Measurements Of Natural And Artificial Targets Using A Mid-Infrared Laser Reflectance Sensor, Ram M. Narayanan, Steven E. Green Jan 1994

Field Measurements Of Natural And Artificial Targets Using A Mid-Infrared Laser Reflectance Sensor, Ram M. Narayanan, Steven E. Green

Department of Electrical and Computer Engineering: Faculty Publications

tunable mid-infrared CO2 laser reflectance sensor operating in the 9-11 pm wavelength range has been developed and field-tested at the University of Nebraska. This system is capable of gathering reflectance data at various wavelengths, incidence angles and linear polarization combinations. Preliminary measurements of various natural and artificial targets such as soil, coniferous and deciduous trees, concrete and brick building material at distances of up to 100 m demonstrate the potential of this system to characterize the mid-infrared reflectance of terrain features for remote sensing applications. Field-acquired data compare well with data on similar materials measured in the laboratory under …