Open Access. Powered by Scholars. Published by Universities.®

Engineering Commons

Open Access. Powered by Scholars. Published by Universities.®

Electrical and Computer Engineering

University of Kentucky

Theses/Dissertations

Double-Ended

Publication Year

Articles 1 - 2 of 2

Full-Text Articles in Engineering

Traveling Wave Fault Location Method For Distribution Systems With Distributed Generation, Oluwafeyisayo Afolabi Jan 2021

Traveling Wave Fault Location Method For Distribution Systems With Distributed Generation, Oluwafeyisayo Afolabi

Theses and Dissertations--Electrical and Computer Engineering

Fault location is an important topic within electric power systems, as accurate fault location techniques will improve the reliability of the system and reduce downtime caused by outages. This paper explores fault location in distribution systems with distributed generation using the traveling wave fault location method. The single-ended and double-ended traveling wave methods are evaluated using a single-circuit distribution system which is modeled using MATLAB SIMULINK. The results are compared using a basis of signals and bus pairs across fault types, sampling rates and fault resistances.


Fault Location Techniques Using The Traveling Wave Method And The Discrete Wavelet Transform, Wesley Fluty Jan 2019

Fault Location Techniques Using The Traveling Wave Method And The Discrete Wavelet Transform, Wesley Fluty

Theses and Dissertations--Electrical and Computer Engineering

Fault location within electric power systems is an important topic that helps reduce outage duration and increases reliability of the system. This paper explores the topic of fault location using traveling waves generated by fault conditions and the discrete wavelet transform used for time-frequency analysis. The single-ended and double-ended traveling wave methods are presented and evaluated on a single circuit and double circuit 500kV system modeled using MATLAB SIMULINK. Results are compared on the basis of wavelet used for analysis, sampling rate, and fault resistance.