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The Testing And The Automation Of Dark Current, Photoresponse And Responsivity Measurements For On-Wafer Metal Semiconductor Metal (W-Msm) Photodetectors, Tiffany Evette Monroe

Electronic Dissertations and Theses

This paper presents the testing and the automation of dark current, photoresponse, and responsivity measurements for W-MSM photodetectors. The testing phase of this particular photodetector is performed in order to compare manual measurement results with automated measurement results done in Lab VIEW. The automation phase is performed in order to take measurements quickly and efficiently using Lab VIEW programs which imitate the functions of actual instruments used to take dark current, photoresponse, and responsivity measurements. So far, only the dark current measurements can be automated. However, in the future, Lab VIEW programs will be written in order to automate the …