Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 2 of 2
Full-Text Articles in Engineering
Statistical Modeling And Simulation Of Variability And Reliability Of Cmos Technology, Khaled Hassan Md
Statistical Modeling And Simulation Of Variability And Reliability Of Cmos Technology, Khaled Hassan Md
Open Access Dissertations
The introduction of High-κ Metal Gate transistors led to higher integration density, low leakage current, and faster switching speed. However, this transition in technology roadmap brought about new failure mechanisms such as Positive Bias Temperature Instability and Stress Induced Leakage Current. In addition, the relentless downscaling of devices to keep up with Moore's law has significantly increased the time-zero variability caused by Random Dopant Fluctuation, Mean Gate Length Deviation, and Line Edge Roughness. Because of their possible correlation with time dependent aging effects, the quantification of reliability has become more complex than ever. To that effect, we propose a framework …
Technology Agnostic Analysis And Design For Improved Performance, Variability, And Reliability In Thin Film Photovoltaics, Sourabh Dongaonkar
Technology Agnostic Analysis And Design For Improved Performance, Variability, And Reliability In Thin Film Photovoltaics, Sourabh Dongaonkar
Open Access Dissertations
Thin film photovoltaics (TFPV) offer low cost alternatives to conventional crystalline Silicon (c-Si) PV, and can enable novel applications of PV technology. Their large scale adoption however, requires significant improvements in process yield, and operational reliability. In order to address these challenges, comprehensive understanding of factors affecting panel yield, and predictive models of performance reliability are needed. This has proved to be especially challenging for TFPV for two reasons in particular. First, TFPV technologies encompass a wide variety of materials, processes, and structures, which fragments the research effort. Moreover, the monolithic manufacturing of TFPV modules differs significantly from that of …