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Application Of Inter-Die Rank Statistics In Defect Detection, Vivek Bakshi
Application Of Inter-Die Rank Statistics In Defect Detection, Vivek Bakshi
Dissertations and Theses
This thesis presents a statistical method to identify the test escapes. Test often acquires parametric measurements as a function of logical state of a chip. The usual method of classifying chips as pass or fail is to compare each state measurement to a test limit. Subtle manufacturing defects are escaping the test limits due to process variations in deep sub-micron technologies which results in mixing of healthy and faulty parametric test measurements. This thesis identifies the chips with subtle defects by using rank order of the parametric measurements. A hypothesis is developed that a defect is likely to disturb the …