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Electrical and Computer Engineering
Missouri University of Science and Technology
<p>Electromagnetic interference<br />Electromagnetic compatibility<br />Near-fields -- Measurement<br />Synthetic aperture radar<br />Three-dimensional printing</p>
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Emission Source Microscopy Applications On Emi Source Localization And Emi Mitigation With Lossy Materials, Xiangyang Jiao
Emission Source Microscopy Applications On Emi Source Localization And Emi Mitigation With Lossy Materials, Xiangyang Jiao
Masters Theses
"In Section 1, the emission source microscopy (ESM) methodology will be introduced and used to identify the sources of radiation on different DUTs. As the new technology generation, the integration density and the operating speed of integrated circuits have been increasing steadily. However, root cause diagnostics to locate the source of EMI radiation is more problematic in the complex system. The ESM technique provides a powerful tool to detect and characterize the active sources of radiation. The amplitude and phase of fields are measured on a plane away from the DUT, and this measurement can get rid of the evanescent …