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Characterization Of Hybrid Electronic Materials Using Atomic Force Microscopy, Madhavi Divakar Rajathadripura

LSU Master's Theses

Miniaturization in the electronics industry has been driven by advancements in material science. Recently, Hybrid Electronic Materials (HEMs) have been postulated to have unique material properties that can be used within the semiconductor industry. As such, the main focus of this research is to characterize the relevant properties of HEMs using atomic force microscopy (AFM), conductive probe atomic force microscopy (CP-AFM), and Raman spectroscopy techniques. Emphasis is placed on characterizing [R6G][TPB] GUMBOS which are a Group of Uniform Materials Based on Organic Salts. GUMBOS exhibit properties such as fluorescence and magnetic susceptibility, both of which may be important with respect …