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A Study Of Phase Noise And Jitter In Submicron Cmos Phase-Locked Loop Circuits, Chi Zhang
A Study Of Phase Noise And Jitter In Submicron Cmos Phase-Locked Loop Circuits, Chi Zhang
LSU Doctoral Dissertations
Phase-locked loops (PLLs) are widely used in communication systems. With the continuously expanding of market for high speed, portable communication devices, low noise CMOS submicron integrated circuit designs of PLL for different applications are in large demand. In this dissertation, phase noise and jitter properties of PLL and its building blocks are investigated both at the physical and system levels. At the physical level, hot carrier effect in submicron MOSFETs has been considered. As one of the most dominant noise sources of PLL, the voltage-controlled oscillator (VCO) is considered when investigating the noise degradation induced by the hot carrier effect. …
Exploring The Hot-Carrier Effect On The Wireless Transceivers, Sameer R. Herlekar
Exploring The Hot-Carrier Effect On The Wireless Transceivers, Sameer R. Herlekar
LSU Doctoral Dissertations
Phase noise can be regarded as the most severe cause of performance degradation in the wireless communication systems. The hot-carriers (HCs), found in the CMOS synchronization circuits, are the high-energy charge carriers that degrade the MOSFET devices’ performance by increasing the threshold voltage required to operate the MOSFETs. The HC effect manifests itself as the phase noise whose level increases with the continued MOSFET operation and such increases result in the performance degradation of the voltage-controlled oscillator (VCO) built on the MOSFETs. The HC effect is particularly evident in the short-channel MOSFET devices. In this dissertation, we analyze the wireless …