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Correlation Of Fault-Injection To Proton Accelerator Persistent Cross Section Measurements, Keith S. Morgan, Michael J. Wirthlin
Correlation Of Fault-Injection To Proton Accelerator Persistent Cross Section Measurements, Keith S. Morgan, Michael J. Wirthlin
Faculty Publications
Sponsorship: Los Alamos National Laboratory. Field Programmable Gate Arrays (FPGAs) are an attractive solution for space system electronics. Unfortunately, FPGAs are susceptible to radiation-induced single-event upsets (SEU). As such, the FPGA Reliability Studies research group (http://reliability.ee.byu.edu) at Brigham Young University has studied ways to effectively measure the static, dynamic and persistent cross sections of an FPGA desgin; each of which are characterized in some way by how the part reacts to an SEU. One such method is to actually radiate an FPGA and monitor how it reacts to SEUs. A cheaper, more efficient solution is to use fault-injection to emulate …
Predicting On-Orbit Seu Rates, Keith S. Morgan, Michael J. Wirthlin
Predicting On-Orbit Seu Rates, Keith S. Morgan, Michael J. Wirthlin
Faculty Publications
As process geometry sizes continue to decrease, microelectronics are becoming more vulnerable to the effects of radiation. Of particular concern are the effects of Single-Event Upsets (SEU) in Field Programmable Gate Arrays (FPGA). An SEU causes a dynamic memory element, such as a flip-flop or latch, to unwantedly change state. Since FPGAs are becoming an increasingly attractive solution for space system electronics, it is desirable to predict static on-orbit SEU rates likely to be encountered by a particular device for any particular orbit. Mean Time Between Failure (MTBF) can directly be calculated from a static SEU rate, allowing a system …