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Integrated Circuit Wear-Out Prediction And Recycling Detection Using Radio-Frequency Distinct Native Attribute Features, Randall D. Deppensmith
Integrated Circuit Wear-Out Prediction And Recycling Detection Using Radio-Frequency Distinct Native Attribute Features, Randall D. Deppensmith
Theses and Dissertations
Radio Frequency Distinct Native Attribute (RF-DNA) has shown promise for detecting differences in Integrated Circuits(IC) using features extracted from a devices Unintentional Radio Emissions (URE). This ability of RF-DNA relies upon process variation imparted to a semiconductor device during manufacturing. However, internal components in modern ICs electronically age and wear out over their operational lifetime. RF-DNA techniques are adopted from prior work and applied to MSP430 URE to address the following research goals: 1) Does device wear-out impact RF-DNA device discriminability?, 2) Can device age be continuously estimated by monitoring changes in RF-DNA features?, and 3) Can device age state …