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Engineering Commons

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Electrical and Computer Engineering

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Florida Institute of Technology

2008

Surface roughness

Articles 1 - 2 of 2

Full-Text Articles in Engineering

Porous Silicon Surface Feature Size Estimation Using The Reflectance Spectrum, Christopher G. Lowrie, Susan K. Earles, Maria E. Pozo De Fernandez Feb 2008

Porous Silicon Surface Feature Size Estimation Using The Reflectance Spectrum, Christopher G. Lowrie, Susan K. Earles, Maria E. Pozo De Fernandez

Electrical Engineering and Computer Science Faculty Publications

In this paper we excite the surface of porous silicon with incoherent, broad band white light and observe the spectrum of colors reflected from the surface. Using an atomic force microscope images from red and green porous silicon samples are collected. In this paper we relate the optical color of the surface to the size of scattering features on the textured surface. From image segmentation using the watershed transform the height distributions of the optical scattering features are determined. The heights of these surface features are then used as input variables to a computer simulation of a reflective grating. The …


Hydrogen Sensor Using Optical Reflectance From Porous Silicon With A Palladium Thin Film, Christopher G. Lowrie, Susan K. Earles, Maria E. Pozo De Fernandez Feb 2008

Hydrogen Sensor Using Optical Reflectance From Porous Silicon With A Palladium Thin Film, Christopher G. Lowrie, Susan K. Earles, Maria E. Pozo De Fernandez

Electrical Engineering and Computer Science Faculty Publications

Results of a hydrogen sensor based on light scattering from a porous silicon surface coated with a thin palladium film are discussed. Reflected light scattered from the rough surface of porous silicon surface with a thin palladium film is compared before and after exposure to hydrogen gas. After exposure to hydrogen gas the sensor's optical reflectance is decreased indicating the presence of hydrogen.