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Post Silicon Clock Tuning System To Mitigate The Impact Of Process Variation On Performance, Kelageri Nagaraj
Post Silicon Clock Tuning System To Mitigate The Impact Of Process Variation On Performance, Kelageri Nagaraj
Masters Theses 1911 - February 2014
Optical shrink for process migration, manufacturing process variation and dynamic voltage control leads to clock skew as well as path delay variation in a manufactured chip. Since such variations are difficult to predict in pre-silicon phase, tunable clock buffers have been used in several microprocessor designs. The buffer delays are tuned to improve maximum operating clock frequency of a design. This however shifts the burden of finding tuning settings for individual clock buffers to the test process. In this project, we describe a process of using tester measurements to determine the settings of the tunable buffers for recovery of performance …
Application Specific Customization And Scalability Of Soft Multiprocessors, Deepak C. Unnikrishnan
Application Specific Customization And Scalability Of Soft Multiprocessors, Deepak C. Unnikrishnan
Masters Theses 1911 - February 2014
Soft multiprocessor systems exploit the plentiful computational resources available in field programmable devices. By virtue of their adaptability and ability to support coarse grained parallelism, they serve as excellent platforms for rapid prototyping and design space exploration of embedded multiprocessor applications. As complex applications emerge, careful mapping, processor and interconnect customization are critical to the overall performance of the multiprocessor system. In this thesis, we have developed an automated scalable framework to efficiently map applications written in a high-level programmer-friendly language to customizable soft-cores. The framework allows the user to specify the application in a high-level language called Streamit. After …
A Hardware Framework For Yield And Reliability Enhancement In Chip Multiprocessors, Abhisek Pan
A Hardware Framework For Yield And Reliability Enhancement In Chip Multiprocessors, Abhisek Pan
Masters Theses 1911 - February 2014
Device reliability and manufacturability have emerged as dominant concerns in end-of-road CMOS devices. Today an increasing number of hardware failures are attributed to device reliability problems that cause partial system failure or shutdown. Also maintaining an acceptable manufacturing yield is seen as challenge because of smaller feature sizes, process variation, and reduced headroom for burn-in tests. In this project we investigate a hardware-based scheme for improving yield and reliability of a homogeneous chip multiprocessor (CMP). The proposed solution involves a hardware framework that enables us to utilize the redundancies inherent in a multi-core system to keep the system operational in …