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Computer and Systems Architecture
University of Massachusetts Amherst
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A Hardware Framework For Yield And Reliability Enhancement In Chip Multiprocessors, Abhisek Pan
A Hardware Framework For Yield And Reliability Enhancement In Chip Multiprocessors, Abhisek Pan
Masters Theses 1911 - February 2014
Device reliability and manufacturability have emerged as dominant concerns in end-of-road CMOS devices. Today an increasing number of hardware failures are attributed to device reliability problems that cause partial system failure or shutdown. Also maintaining an acceptable manufacturing yield is seen as challenge because of smaller feature sizes, process variation, and reduced headroom for burn-in tests. In this project we investigate a hardware-based scheme for improving yield and reliability of a homogeneous chip multiprocessor (CMP). The proposed solution involves a hardware framework that enables us to utilize the redundancies inherent in a multi-core system to keep the system operational in …