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Markov Chain Monte Carlo Defect Identification In Nde Images, Aleksandar Dogandžić, Benhong Zhang
Markov Chain Monte Carlo Defect Identification In Nde Images, Aleksandar Dogandžić, Benhong Zhang
Aleksandar Dogandžić
We derive a hierarchical Bayesian method for identifying elliptically‐shaped regions with elevated signal levels in NDE images. We adopt a simple elliptical parametric model for the shape of the defect region and assume that the defect signals within this region are random following a truncated Gaussian distribution. Our truncated‐Gaussian model ensures that the signals within the defect region are higher than the baseline level corresponding to the noise‐only case. We derive a closed‐form expression for the kernel of the posterior probability distribution of the location, shape, and defect‐signal distribution parameters (model parameters). This result is then used to develop Markov …