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Electrical and Computer Engineering Faculty Research & Creative Works

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Probabilistic Balancing Of Fault Coverage And Test Cost In Combined Built-In Self-Test/Automated Test Equipment Testing Environment, Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi Oct 2004

Probabilistic Balancing Of Fault Coverage And Test Cost In Combined Built-In Self-Test/Automated Test Equipment Testing Environment, Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi

Electrical and Computer Engineering Faculty Research & Creative Works

As design and test complexities of SoCs ever intensify, the balanced utilization of combined built-in self-test (BIST) and automated test equipment (ATE) testing becomes desirable to meet the required minimum-fault-coverage while maintaining an acceptable cost overhead. The cost associated with combined BIST/ATE testing of such systems mainly consists of 1) the cost induced by the BIST area overhead and 2) the cost induced by the overall testing time. In general, BIST is significantly faster than ATE, while it can provide only limited fault-coverage, and driving higher fault-coverage from BIST means additional area cost overhead. On the other hand, higher fault-coverage …

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Eaf Voltage Flicker Mitigation By Facts/Ess, Li Zhang, Yilu Liu, Michael R. Ingram, Dale T. Bradshaw, Steve Eckroad, Mariesa Crow Oct 2004

Eaf Voltage Flicker Mitigation By Facts/Ess, Li Zhang, Yilu Liu, Michael R. Ingram, Dale T. Bradshaw, Steve Eckroad, Mariesa Crow

Electrical and Computer Engineering Faculty Research & Creative Works

One of the problems caused by an electrical arc furnace (EAF) is voltage fluctuation from the variations of the active and reactive furnace load, which are known as voltage flickers. In this paper, voltage flicker mitigation results by different FACTS and energy storage systems (ESS) were presented. The system X/R ratio looking from the point of common coupling, which has a special impact on the effectiveness of active compensation, was discussed. The study has clarified the misunderstanding of how the system X/R ratio should be calculated. The study showed that FACTS with ESS could play a better role than reactive …

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Evaluating Conduction Loss Of A Parallel Igbt-Mosfet Combination, Jonathan W. Kimball, Patrick L. Chapman Oct 2004

Evaluating Conduction Loss Of A Parallel Igbt-Mosfet Combination, Jonathan W. Kimball, Patrick L. Chapman

Electrical and Computer Engineering Faculty Research & Creative Works

A variety of power devices are available to designers, each with specific advantages and limitations. For inverters, typically an IGBT combined with a p-i-n diode is used to obtain high current density. Recent developments in high-voltage MOSFETs support other alternatives. For example, a MOSFET can be paralleled with an IGBT to reduce losses at low currents, while the IGBT carries the load at high currents. The current work evaluates conduction losses in this configuration, showing applicability to generic inverters.

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An Error Analysis Of The Multirate Method For Power System Transient Stability Simulation, Jingjia Chen, Mariesa Crow, Badrul H. Chowdhury, Levent Acar Oct 2004

An Error Analysis Of The Multirate Method For Power System Transient Stability Simulation, Jingjia Chen, Mariesa Crow, Badrul H. Chowdhury, Levent Acar

Electrical and Computer Engineering Faculty Research & Creative Works

This efficient application of any numerical integration method depends on accurate estimation of the local truncation error to govern step size control. In this paper, the local truncation error of the multirate method using the forward Euler integration is derived leading to the calculation of the optimal step ratio. The techniques of applying multirate method in power systems are discussed. By implementing the multirate method in a practical power system example, the multirate strategies are proved to be efficient compared with traditional simulation methods.

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Bulk Power System Low Frequency Oscillation Suppression By Facts/Ess, Li Zhang, Y. Liu, Michael R. Ingram, Dale T. Bradshaw, Steve Eckroad, Mariesa Crow Oct 2004

Bulk Power System Low Frequency Oscillation Suppression By Facts/Ess, Li Zhang, Y. Liu, Michael R. Ingram, Dale T. Bradshaw, Steve Eckroad, Mariesa Crow

Electrical and Computer Engineering Faculty Research & Creative Works

Low frequency oscillations in the interconnected power systems are observed all around the world. In this paper, the authors studied the inter-area mode low frequency oscillations by analyzing the phenomena in Nashville area of the Tennessee Valley Authority (TVA) system. Our study revealed 4 dynamic groups of generators in this area. Within each group, generators swing together and have the same dynamic trend. Generators from different dynamic groups swing against each other. The authors studied the possibility of using a FACTS/ESS controller to damp the low frequency oscillations in Nashville area. The active power is controlled to damp the low …

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Modeling Yield Of Carbon-Nanotube/Silicon-Nanowire Fet-Based Nanoarray Architecture With H-Hot Addressing Scheme, Shanrui Zhang, Minsu Choi, Nohpill Park Oct 2004

Modeling Yield Of Carbon-Nanotube/Silicon-Nanowire Fet-Based Nanoarray Architecture With H-Hot Addressing Scheme, Shanrui Zhang, Minsu Choi, Nohpill Park

Electrical and Computer Engineering Faculty Research & Creative Works

With molecular-scale materials, devices and fabrication techniques recently being developed, high-density computing systems in the nanometer domain emerge. An array-based nanoarchitecture has been recently proposed based on nanowires such as carbon nanotubes (CNTs) and silicon nanowires (SiNWs). High-density nanoarray-based systems consisting of nanometer-scale elements are likely to have many imperfections; thus, defect-tolerance is considered one of the most significant challenges. In this paper we propose a probabilistic yield model for the array-based nanoarchitecture. The proposed yield model can be used (1) to accurately estimate the raw and net array densities, and (2) to design and optimize more defect and fault-tolerant …

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Integrated Vlsi Potentiostat For Cyclic Voltammetry In Electrolytic Reactions, Harpreet S. Narula, John G. Harris Sep 2004

Integrated Vlsi Potentiostat For Cyclic Voltammetry In Electrolytic Reactions, Harpreet S. Narula, John G. Harris

Electrical and Computer Engineering Faculty Research & Creative Works

This paper describes a CMOS integrated potentiostatic control circuit. The design maintains a constant bias potential between the reference and working electrodes for an amperometric chemical sensor. A technique of converting input currents into time for amperometric measurements is proposed. Redox currents ranging from IpA to 200nA can be measured with a maximum non-linearity of ±0.1% over this range. The design can be used to generate a cyclic voltammogram for an electrochemical reaction by sweeping the voltages across the range specified by the user. Analog inputs are processed, and digital outputs are generated without requiring a power-hungry A/D converter. A …

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Multi-Class Cancer Classification By Semi-Supervised Ellipsoid Artmap With Gene Expression Data, Rui Xu, Donald C. Wunsch, Georgios C. Anagnostopoulos Sep 2004

Multi-Class Cancer Classification By Semi-Supervised Ellipsoid Artmap With Gene Expression Data, Rui Xu, Donald C. Wunsch, Georgios C. Anagnostopoulos

Electrical and Computer Engineering Faculty Research & Creative Works

To accurately identify the site of origin of a tumor is crucial to cancer diagnosis and treatment. With the emergence of DNA microarray technologies, constructing gene expression profiles for different cancer types has already become a promising means for cancer classification. In addition to binary classification, the discrimination of multiple tumor types is also important semi-supervised ellipsoid ARTMAP (ssEAM) is a novel neural network architecture rooted in adaptive resonance theory suitable for classification tasks. ssEAM can achieve fast, stable and finite learning and create hyper-ellipsoidal clusters inducing complex nonlinear decision boundaries. Here, we demonstrate the capability of ssEAM to discriminate …

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Low-Input-Voltage, Low-Power Boost Converter Design Issues, Jonathan W. Kimball, Theresa L. Flowers, Patrick L. Chapman Sep 2004

Low-Input-Voltage, Low-Power Boost Converter Design Issues, Jonathan W. Kimball, Theresa L. Flowers, Patrick L. Chapman

Electrical and Computer Engineering Faculty Research & Creative Works

Issues associated with boost converter design and performance are investigated when a low input voltage is used. Low-input-voltage sources include single fuel cells, single solar cells, and thermoelectric devices. The primary context is interfacing single micro fuel cells to portable electronic loads, such as mobile phones. Efficiency and circuit startup are the two most difficult issues for a low-cost design. It is shown in theory and experiment that the boost converter has a voltage collapse point. A simple startup technique is proposed that is appropriate for some applications.

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Exploiting Independent Filter Bandwidth Of Human Factor Cepstral Coefficients In Automatic Speech Recognition, Mark D. Skowronski, John G. Harris Sep 2004

Exploiting Independent Filter Bandwidth Of Human Factor Cepstral Coefficients In Automatic Speech Recognition, Mark D. Skowronski, John G. Harris

Electrical and Computer Engineering Faculty Research & Creative Works

Mel frequency cepstral coefficients (MFCC) are the most widely used speech features in automatic speech recognition systems, primarily because the coefficients fit well with the assumptions used in hidden Markov models and because of the superior noise robustness of MFCC over alternative feature sets such as linear prediction-based coefficients. The authors have recently introduced human factor cepstral coefficients (HFCC), a modification of MFCC that uses the known relationship between center frequency and critical bandwidth from human psychoacoustics to decouple filter bandwidth from filter spacing. In this work, the authors introduce a variation of HFCC called HFCC-E in which filter bandwidth …

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Electromagnetic Interference Of System On Package, Toshio Sudo, Hideki Sasaki, Norio Masuda, James L. Drewniak Aug 2004

Electromagnetic Interference Of System On Package, Toshio Sudo, Hideki Sasaki, Norio Masuda, James L. Drewniak

Electrical and Computer Engineering Faculty Research & Creative Works

Electromagnetic interference (EMI) issues are expected to be crucial for next-generation system-on-package (SOP) integrated high-performance digital LSIs and for radio frequency (RF) and analog circuits. Ordinarily in SOPs, high-performance digital LSIs are sources of EMI, while RF and analog circuits are affected by EMI (victims). This paper describes the following aspects of EMI in SOPs: 1) die/package-level EMI; 2) substrate-level EMI; 3) electromagnetic modeling and simulation; and 4) near electromagnetic field measurement. First, LSI designs are discussed with regard to radiated emission. The signal-return path loop and switching current in the power/ground line are inherent sources of EMI. The EMI …

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A New Calibration Method For Current Probes, Ramachandran Chundru, David Pommerenke, Sunitha Chandra Aug 2004

A New Calibration Method For Current Probes, Ramachandran Chundru, David Pommerenke, Sunitha Chandra

Electrical and Computer Engineering Faculty Research & Creative Works

EMC engineers often use current probes to detect common mode currents. It is necessary to characterize the probes up to Giga Hertz frequencies. Existing calibration methods for current clamps suffer from the problem of not directly measuring the current within the current clamp. Instead they either reconstruct the current from measurements at other locations or they use assumptions regarding the geometry which allows them to use a current that is measured at a different location without applying a mathematical correction. The proposed method overcomes these disadvantages by directly measuring the current at the center of the current clamp. This paper …

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The Design Of A Lumped Element Impedance-Matching Network With Reduced Parasitic Effects Obtained From Numerical Modeling, Shaofeng Luan, Jun Fan, James L. Knighten, Norman W. Smith Aug 2004

The Design Of A Lumped Element Impedance-Matching Network With Reduced Parasitic Effects Obtained From Numerical Modeling, Shaofeng Luan, Jun Fan, James L. Knighten, Norman W. Smith

Electrical and Computer Engineering Faculty Research & Creative Works

This paper presents an impedance-matching network design with numerical modeling of the parasitic effects. A modeling tool CEMPIE (a Circuit Extraction approach based on a Mixed Potential Integral Equation formulation) is used to model the hoard-level parasitics of surface mount technology (SMT) resistors for impedance-matching networks. A 3-layer design of impedance-matching network with 0402 SMT resistors is implemented according to the modeling results. And its performance is demonstrated.

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Comparison Of Via Equivalent Circuit Model Accuracy Using Quasi-Static And Full-Wave Approaches, Bruce Archambeault, Samuel R. Connor, Jianmin Zhang, James L. Drewniak, Mauro Lai, Antonio Orlandi, Giulio Antonini, Albert E. Ruehli Aug 2004

Comparison Of Via Equivalent Circuit Model Accuracy Using Quasi-Static And Full-Wave Approaches, Bruce Archambeault, Samuel R. Connor, Jianmin Zhang, James L. Drewniak, Mauro Lai, Antonio Orlandi, Giulio Antonini, Albert E. Ruehli

Electrical and Computer Engineering Faculty Research & Creative Works

The EMC and signal integrity impact of printed circuit board (PCB) trace discontinuities, such as vias, where the signal is transitioned from one layer to another in the PCB stackup, have become significant recently with the use of very high speed signals in today''s systems. If these discontinuities are ignored, significant distortion of the high speed signal can occur, and in many cases, cause data errors. A fast and accurate technique to include the effect of via discontinuities in the typical design process is needed to ensure this distortion is considered if significant. Therefore, a simple equivalent circuit for the …

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Comparison Of Water And Saltwater Movement In Mortar Based On A Semiempirical Electromagnetic Model, Shanup Peer, R. Zoughi Aug 2004

Comparison Of Water And Saltwater Movement In Mortar Based On A Semiempirical Electromagnetic Model, Shanup Peer, R. Zoughi

Electrical and Computer Engineering Faculty Research & Creative Works

The presence of chloride ions in steel-reinforced structures leads to the corrosion of the reinforcement thus compromising the integrity and strength of the structure. Thus, it is of great interest to nondestructively detect and evaluate free chloride content in concrete. To this end, an investigation was initiated where two mortar cubes were soaked in distilled water and saltwater solutions, respectively. Their temporal microwave reflection properties were measured using open-ended rectangular waveguides on a daily basis for three cycles, each lasting 35 days. Subsequently, a semiempirical electromagnetic model was developed to simulate the reflection properties of the cubes. The outcome of …

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Digital Scr Control Box For Educational Laboratory, Zakdy Sorchini, Jonathan W. Kimball, Philip T. Krein Aug 2004

Digital Scr Control Box For Educational Laboratory, Zakdy Sorchini, Jonathan W. Kimball, Philip T. Krein

Electrical and Computer Engineering Faculty Research & Creative Works

A "blue box" has been designed to introduce the silicone controlled rectifier (SCR) to power electronics students. SCRs are useful in many real-world applications, and are conceptually important in a student's understanding of power converters. The box is highly flexible in application, and its internal design is simple enough to explain to students. Experiments are shown, both of the type commonly used in the laboratory and of the type used for demonstrations. The box has also been designed to be suitable for research purposes and line voltage applications.

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Expert System Algorithms For Identifying Radiated Emission Problems In Printed Circuit Boards, Hwan-Woo Shim, Todd H. Hubing, Thomas Van Doren, Richard E. Dubroff, James L. Drewniak, David Pommerenke, R. Kaires Aug 2004

Expert System Algorithms For Identifying Radiated Emission Problems In Printed Circuit Boards, Hwan-Woo Shim, Todd H. Hubing, Thomas Van Doren, Richard E. Dubroff, James L. Drewniak, David Pommerenke, R. Kaires

Electrical and Computer Engineering Faculty Research & Creative Works

Radiated emission algorithms for a printed circuit board EMC expert system are described. The expert system mimics the thinking processes that human EMC engineers would use to analyze circuit boards and make design recommendations. Working with limited information about the enclosure, cables or the exact nature of the signals, the expert system evaluates different structures on the printed circuit board looking for potentially strong radiated emission sources. Results obtained from the analysis of a sample printed circuit board are provided to demonstrate how the expert system quickly identifies problems that would otherwise be difficult to locate.

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Extraction Of A Spice Via Model From Full-Wave Modeling For Differential Signaling, Shaofeng Luan, Giuseppe Selli, James L. Drewniak, Andrea De Luca, Giulio Antonini, Antonio Orlandi, Antonio Ciccomancini Scogna, Jun Fan, James L. Knighten, Norman W. Smith, Ray Alexander Aug 2004

Extraction Of A Spice Via Model From Full-Wave Modeling For Differential Signaling, Shaofeng Luan, Giuseppe Selli, James L. Drewniak, Andrea De Luca, Giulio Antonini, Antonio Orlandi, Antonio Ciccomancini Scogna, Jun Fan, James L. Knighten, Norman W. Smith, Ray Alexander

Electrical and Computer Engineering Faculty Research & Creative Works

This paper presents a procedure for building SPICE models for via transitions in differential signaling. The method of extracting parameters of SPICE models from a full-wave simulation tool is demonstrated. Then the validity of the SPICE models is studied by comparing the solution from the SPICE models with that from the full-wave simulation.

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Feedback Linearization Based Power System Stabilizer Design With Control Limits, Wenxin Liu, Ganesh K. Venayagamoorthy, Donald C. Wunsch, Jagannathan Sarangapani Aug 2004

Feedback Linearization Based Power System Stabilizer Design With Control Limits, Wenxin Liu, Ganesh K. Venayagamoorthy, Donald C. Wunsch, Jagannathan Sarangapani

Electrical and Computer Engineering Faculty Research & Creative Works

In power system controls, simplified analytical models are used to represent the dynamics of power system and controller designs are not rigorous with no stability analysis. One reason is because the power systems are complex nonlinear systems which pose difficulty for analysis. This paper presents a feedback linearization based power system stabilizer design for a single machine infinite bus power system. Since practical operating conditions require the magnitude of control signal to be within certain limits, the stability of the control system under control limits is also analyzed. Simulation results under different kinds of operating conditions show that the controller …

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Static And Quasi-Dynamic Load Balancing In Parallel Fdtd Codes For Signal Integrity, Power Integrity, And Packaging Applications, Sarah A. Seguin, Michael A. Cracraft, James L. Drewniak Aug 2004

Static And Quasi-Dynamic Load Balancing In Parallel Fdtd Codes For Signal Integrity, Power Integrity, And Packaging Applications, Sarah A. Seguin, Michael A. Cracraft, James L. Drewniak

Electrical and Computer Engineering Faculty Research & Creative Works

The Finite-Difference Time-Domain (FDTD) method is a robust technique for calculating electromagnetic fields, but practical problems, involving complex or large geometries, can require a long time to calculate on any one single-processor computer. One computer with many processors or many single-processor computers can reduce the computation time. However, some FDTD cell types, e.g., PML cells, require more computation time than others. Thus, the size and shape of the individual process allocations can significantly influence the computation time. This paper addresses these load balancing issues with static and quasi-dynamic approaches. The Message-Passing Interface (MPI) library is applied to a three-dimensional (3D) …

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An Extrapolation Procedure To Shorten Time Domain Simulations, Giuseppe Selli, James L. Drewniak, David Pommerenke Aug 2004

An Extrapolation Procedure To Shorten Time Domain Simulations, Giuseppe Selli, James L. Drewniak, David Pommerenke

Electrical and Computer Engineering Faculty Research & Creative Works

Time-domain simulation algorithms are widely used in the anaylsis and design of electromagnetic systems. Many of them are characterized by high Q's. Thus, the simulations have to employ many time steps in order to achieve a complete characterization of these systems. This time-consuming computational effort can be avoided if the late instants of time are extrapolated by applying a parametric estimation algorithm. An optimized implementation of a time-domain extrapolation method and a stop criterion are discussed in this paper. The latter criterion is based upon a normalized squared difference between the waveforms extrapolated from two different sets of initial data …

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Defect Characterization And Yield Analysis Of Array-Based Nanoarchitecture, Shanrui Zhang, Minsu Choi, Nohpill Park Aug 2004

Defect Characterization And Yield Analysis Of Array-Based Nanoarchitecture, Shanrui Zhang, Minsu Choi, Nohpill Park

Electrical and Computer Engineering Faculty Research & Creative Works

With molecular-scale materials and fabrication techniques recently developed, high-density computing systems in nanometer domain emerge. An array-based nanoarchitecture has been recently proposed based on nanowires such as carbon nanotubes (CNTs), silicon nanowires (SiNWs). High-density nanoarray-based systems consisting of nanometer-scale elements are likely to have many imperfections; thus, defect-tolerance is considered as one of the most significant challenges. In this paper, we propose a probabilistic yield model for the array-based nanoarchitecture. The proposed yield model can be used 1) to accurately estimate the raw and net array densities, and 2) to design and optimize more defect and fault-tolerant systems based on …

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A Method Of Including Switching Loss In Electro-Thermal Simulations, Jonathan W. Kimball Aug 2004

A Method Of Including Switching Loss In Electro-Thermal Simulations, Jonathan W. Kimball

Electrical and Computer Engineering Faculty Research & Creative Works

Often, power electronics systems are simulated with ideal switching elements, perhaps augmented with conduction loss models. A behavioral model is proposed that also includes switching loss and is independent of switching frequency. Therefore, it is suitable for variable frequency control methods, including hysteresis, delta modulation, and random PWM. Models have been realized in Dymola using voltage-controlled voltage sources, current sources, logic, and additional ideal switches. Thermal ports are included to facilitate electro-thermal simulation. A method for parameter extraction is demonstrated using experimental data from standard PWM.

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Anticipating Emi And On-Board Interference In Automotive Platforms, Shishuang Sun, Geping Liu, David Pommerenke, James L. Drewniak, Richard W. Kautz, Chingchi Chen Aug 2004

Anticipating Emi And On-Board Interference In Automotive Platforms, Shishuang Sun, Geping Liu, David Pommerenke, James L. Drewniak, Richard W. Kautz, Chingchi Chen

Electrical and Computer Engineering Faculty Research & Creative Works

A dual-step MTL / FDTD strategy is proposed for anticipating full-vehicle level EMI. In the first step, the current distribution along a cable bundle connecting to electronic modules an an automotive platform is calculated using multi-conductor transmission-line (MTL) models. In order to account for common-mode discontinuities on the vehicle chassis, e.g., slots, 3D full-wave modeling (FDTD) is used to determine radiation impedances, which are thereafter incorporated in the MTL models for compensating the radiation power loss. In the second step, the obtained currents are implemented as impressed current sources in full-vehicle full-wave modeling using an FDTD multi-wire subcelluar algorithm. Thus, …

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A Circuit Approach To Model Narrow Slot Structures In A Power Bus, Lin Zhang, Ray Alexander, Richard E. Dubroff, James L. Drewniak, James L. Knighten, Norman W. Smith, Bruce Archambeault, Samuel R. Connor, Jun Fan Aug 2004

A Circuit Approach To Model Narrow Slot Structures In A Power Bus, Lin Zhang, Ray Alexander, Richard E. Dubroff, James L. Drewniak, James L. Knighten, Norman W. Smith, Bruce Archambeault, Samuel R. Connor, Jun Fan

Electrical and Computer Engineering Faculty Research & Creative Works

A coupled transmission line model for narrow slot structures in DC power planes is proposed. This approach, combined with SPICE-based cavity models and a segmentation method, provides an easy and fast way to model relatively complex structures of power planes with narrow slots often used for isolation purposes. This approach is used to achieve isolation using gapping. The cavity model formulations for rectangular and isosceles right triangular segments are reviewed. The rationale of modeling the narrow slot as a three-conductor transmission line is described. The modeling results are shown and compared with the output of a full wave simulation tool, …

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A Cn-Fdtd Scheme And Its Application To Vlsi Interconnects/Substrate Modeling, Rui Qiang, Dagang Wu, Ji Chen, Chen Wang, James L. Drewniak Aug 2004

A Cn-Fdtd Scheme And Its Application To Vlsi Interconnects/Substrate Modeling, Rui Qiang, Dagang Wu, Ji Chen, Chen Wang, James L. Drewniak

Electrical and Computer Engineering Faculty Research & Creative Works

In this paper, a two-dimensional (2D) Crank-Nicholason (CN) finite difference time domain (FDTD) method is proposed for VLSI interconnect/substrate characterization. Through rigorous truncation and dispersion error analyses, a guideline on using this technique is presented. Several iterative solvers are investigated to accelerate the solution of the CN-FDTD scheme. Numerical examples are given to demonstrate the accuracy and the efficiency of the proposed algorithm.

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Radiation Mechanisms For Semiconductor Devices And Packages, Todd H. Hubing, Daryl G. Beetner, Shaowei Deng, Xiaopeng Dong Aug 2004

Radiation Mechanisms For Semiconductor Devices And Packages, Todd H. Hubing, Daryl G. Beetner, Shaowei Deng, Xiaopeng Dong

Electrical and Computer Engineering Faculty Research & Creative Works

VLSI semiconductor devices are often the source of radiated electromagnetic emissions from electronic devices. Noise coupled from these devices to resonant structures on the printed circuit board, resonant cables or resonant enclosures can result in EMI problems that are difficult or expensive to solve at the board or system level. This paper reviews three mechanisms by which noise can be coupled from semiconductor devices and packages resulting in radiated electromagnetic emissions.

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Extracting R, L, G, C Parameters Of Dispersive Planar Transmission Lines From Measured S-Parameters Using A Genetic Algorithm, Jianmin Zhang, Marina Koledintseva, James L. Drewniak, Giulio Antonini, Antonio Orlandi, Konstantin Rozanov Aug 2004

Extracting R, L, G, C Parameters Of Dispersive Planar Transmission Lines From Measured S-Parameters Using A Genetic Algorithm, Jianmin Zhang, Marina Koledintseva, James L. Drewniak, Giulio Antonini, Antonio Orlandi, Konstantin Rozanov

Electrical and Computer Engineering Faculty Research & Creative Works

Signal integrity (SI) analysis of printed circuit boards for high-speed digital design requires information on the perunit-length R, L, G, C parameters of the transmission lines. However, these are not always available when the property of the dielectric medium used in the board is unknown. A method to extract R, L, G, and C parameters from parallel-plate and strip transmission line geometries is proposed. It is based on measured scattering parameters and analytical modeling. A genetic algorithm (GA) is used to optimize the extraction by minimizing the frequency domain discrepancy between an objective function, which is the measured scattering matrix …

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Extraction Of Spice-Type Equivalent Circuits Of Signal Via Transitions Using The Peec Method, Jingkun Mao, James L. Drewniak, Giulio Antonini, Antonio Orlandi Aug 2004

Extraction Of Spice-Type Equivalent Circuits Of Signal Via Transitions Using The Peec Method, Jingkun Mao, James L. Drewniak, Giulio Antonini, Antonio Orlandi

Electrical and Computer Engineering Faculty Research & Creative Works

Digital devices and discontinuities are typically analyzed by inserting their equivalent circuits into SPICE-type simulators. The partial element equivalent circuit method has been proven to be very useful for electromagnetic modeling. It can be used in both the time and the frequency domain. In this paper, the PEEC technique is employed as an efficient full-wave modeling tool to derive SPICE-type equivalent circuits of signal via transition structures. A nodal analysis technique is utilized in conjunction with the optimization algorithm to extract the equivalent circuits, whose component values are the parameters optimized. The good agreement between different approaches demonstrates that the …

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Representation Of Permittivity For Multiphase Dielectric Mixtures In Fdtd Modeling, Marina Koledintseva, J. Wu, H. Zhang, James L. Drewniak, Konstantin Rozanov Aug 2004

Representation Of Permittivity For Multiphase Dielectric Mixtures In Fdtd Modeling, Marina Koledintseva, J. Wu, H. Zhang, James L. Drewniak, Konstantin Rozanov

Electrical and Computer Engineering Faculty Research & Creative Works

A simple method of approximating frequency characteristics of composites in a form convenient for time-domain numerical modeling is proposed. The frequency characteristics can be obtained from experiment or calculations based on the Maxwell Garnett mixing formalism. The resultant frequency characteristic might be of a complex shape corresponding to a combination of a number of absorption peaks. The approximation is made by a series of Debye-like terms using a genetic algorithm (GA). This leads to the necessity of taking a number of terms in the approximating series. Every term corresponds to its pole, i.e., the frequency where the maximum loss occurs. …

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