Physical Sciences and Mathematics Commons^™

Design, Layout, And Testing Of Sige Apds Fabricated In A Bicmos Process, Dane Laurence Gentry

UNLV Theses, Dissertations, Professional Papers, and Capstones

This Thesis is concerned with the design, layout, and testing of avalanche photodiodes (APDs). APDs are a type of photodetector and, thus, convert light signals into electrical signals (current or voltage). APDs can be fabricated using silicon (Si). In this Thesis, however, three integrated circuit (IC) chips containing various silicon-germanium (SiGe) APDs with different sizes, structures, and geometries were designed, laid out, and fabricated using the Austriamicrosystems (AMS) 0.35μm SiGe BiCMOS (S35) process. This was done in order to compare SiGe APDs to Si only APDs and investigate the hypothesis that SiGe APDs are capable of detecting longer wavelengths than …

College Of Engineering Senior Design Competition Fall 2018, University Of Nevada, Las Vegas

Fred and Harriet Cox Senior Design Competition Projects

Part of every UNLV engineering student’s academic experience, the senior design project stimulates engineering innovation and entrepreneurship. Each student in their senior year chooses, plans, designs, and prototypes a product in this required element of the curriculum. A capstone to the student’s educational career, the senior design project encourages the student to use everything learned in the engineering program to create a practical, real world solution to an engineering challenge. The senior design competition helps focus the senior students in increasing the quality and potential for commercial application for their design projects. Judges from local industry evaluate the projects on …

Design On High Performance Nanoscale Cmos Circuits With Low Temperature Sensitivity, Ming Zhu

UNLV Theses, Dissertations, Professional Papers, and Capstones

With the rapid development of integrated circuit (IC) design and manufacturing technology, the transistor size now can be shrunk into only couple of nanometers whereas billions of transistors can be squeezed into a square millimeter, providing unprecedented computation power. However, accompanied with continuous device miniaturization and increased integration density is the explosive growth of on-chip power dissipation and a wide range of temperature fluctuation, which can heavily and negatively affect the delay performance of the circuit, or in the worst case, the circuit may malfunction and the system can be unreliable. Therefore, improved performance resilience against temperature variations has become …

Design & Delivery Of Automated Winston-Lutz Test For Isocentric & Off-Axis Delivery Stability Utilizing Truebeam Developer Mode & Electronic Portal Imaging Device, Mahmoud Mohammad Yaqoub

UNLV Theses, Dissertations, Professional Papers, and Capstones

The uncertainties in treatment delivery cannot be ignored in radiation therapy. Thus, the quality assurance QA tests are very important task of the medical physicist in clinical practice. Assuring the coincidence between the mechanical isocenter of the Linear Accelerator (LINAC) and its radiation beams isocenter is one of the most important qualities need to be tested, and the Winston Lust (WL) test is the

most popular technique to perform this task, especially for the treatment modalities which need high precision in beam delivery such as the stereotactic radiosurgery/stereotactic body radiotherapy (SRS/SBRT). The linear accelerator-based SRS/SBRT is a well-established method in …