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Physical Sciences and Mathematics Commons

Open Access. Powered by Scholars. Published by Universities.®

2009

Portland State University

Charge coupled devices

Articles 1 - 2 of 2

Full-Text Articles in Physical Sciences and Mathematics

Influence Of Illumination On Dark Current In Charge-Coupled Device Imagers, Ralf Widenhorn, Ines Hartwig, Justin Charles Dunlap, Erik Bodegom Sep 2009

Influence Of Illumination On Dark Current In Charge-Coupled Device Imagers, Ralf Widenhorn, Ines Hartwig, Justin Charles Dunlap, Erik Bodegom

Physics Faculty Publications and Presentations

Thermal excitation of electrons is a major source of noise in charge-coupled-device (CCD) imagers. Those electrons are generated even in the absence of light, hence, the name dark current. Dark current is particularly important for long exposure times and elevated temperatures. The standard procedure to correct for dark current is to take several pictures under the same condition as the real image, except with the shutter closed. The resulting dark frame is later subtracted from the exposed image. We address the question of whether the dark current produced in an image taken with a closed shutter is identical to the …


Dark Current Behavior In Dslr Cameras, Justin Charles Dunlap, Oleg Sostin, Ralf Widenhorn, Erik Bodegom Jan 2009

Dark Current Behavior In Dslr Cameras, Justin Charles Dunlap, Oleg Sostin, Ralf Widenhorn, Erik Bodegom

Physics Faculty Publications and Presentations

Digital single-lens reflex (DSLR) cameras are examined and their dark current behavior is presented. We examine the influence of varying temperature, exposure time, and gain setting on dark current. Dark current behavior unique to sensors within such cameras is observed. In particular, heat is trapped within the camera body resulting in higher internal temperatures and an increase in dark current after successive images. We look at the possibility of correcting for the dark current, based on previous work done for scientific grade imagers, where hot pixels are used as indicators for the entire chip?s dark current behavior. Standard methods of …