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Full-Text Articles in Physical Sciences and Mathematics
Heat Flux Capacity Measurement And Improvement For The Test Of Superconducting Logic Circuits In Closed-Cycle Cryostats, Sasan Razmkhah, Ali̇ Bozbey
Heat Flux Capacity Measurement And Improvement For The Test Of Superconducting Logic Circuits In Closed-Cycle Cryostats, Sasan Razmkhah, Ali̇ Bozbey
Turkish Journal of Electrical Engineering and Computer Sciences
With the current progress of superconducting integrated circuits, circuit complexities have reached more than 100,000 Josephson junctions. At the laboratory environment, circuit tests are generally being conducted at liquid Helium environments. With the commercialization of the superconducting integrated circuit-based systems and/or price increase of liquid Helium, utilization of the closed-cycle systems will be inevitable. Even though it is possible to implement closed-cycle systems with quite substantial excess cooling powers after all the wirings and peripheral circuits, one point not to be overlooked is the power density at the superconducting chips. We have observed that the circuits designed for operation at …
Electrical And Structural Properties Of Ex-Situ Annealed Superconducting Bi_2sr_2cacu_2o_8 Thin Films Obtained By Coevaporation Of Components, Necdet Baştürk
Electrical And Structural Properties Of Ex-Situ Annealed Superconducting Bi_2sr_2cacu_2o_8 Thin Films Obtained By Coevaporation Of Components, Necdet Baştürk
Turkish Journal of Physics
Bi_2Sr_2CaCu_2O_8 system superconducting thin films were obtained by synchronized deposition of Bi, Cu, CaF_2 and SrF_2 components onto cleaved MgO (100) single crystal substrates after annealing in the temperature range 600--840 °C. The films were annealed in H_2O and O_2, then dry O_2 atmosphere for the removal of fluorine from the structure and to attain superconducting properties. X-ray powder diffraction patterns were used to characterize the obtained film structure. The films were observed to grow along c-axis perpendicular to the substrate surface with the identified reflection on the (00l, l = 6, 8, 10...) planes. The films having the critical …