Physical Sciences and Mathematics Commons^™

Reliability Characterization Of A Low-K Dielectric Using Its Magnetoresistance As A Diagnostic Tool, Philip Alister Williams

Legacy Theses & Dissertations (2009 - 2024)

The introduction of low dielectric constant materials within the integrated circuit (IC) chip technology industry was a concerted effort to decrease the resistance-capacitance (RC) time delay inherent within the dielectric materials used as insulators. This stems from a demand for greater device density per IC chip and decreased feature sizes but is fast becoming a reliability issue. Concomitant with the demand for decreased feature sizes, also in adherence with Moore’s Law (which states that the number of devices on a die doubles every two years), is a reduction in device speed and performance due to device intra-level interconnection signal delays. …

Nonlinear Optical Studies Of Interfacial Ferroelectricity And Strain Distribution In Perovskite Dielectric Films, Tony Le

Dissertations, Theses, and Capstone Projects

Dielectric and ferroelectric perovskite films have been model energy storage structures for their low-dielectric loss, extremely high charge-discharge speed, and good temperature stability, yet there is still much to understand about the material’s limitations. This dissertation presents a detailed understanding of the strain-induced ferroelectricity at the boundary between a strontium titanate (SrTiO₃) ultrathin film epitaxially grown on a germanium (Ge) substrate through optical second harmonic generation (SHG), and the polydomain distribution in the Zr-doped BaTiO₃ (BZT) films by time-resolved pump-probe spectroscopy.

First, SHG measurements were performed to reveal interfacial ferroelectricity in the epitaxial SrTiO₃/Ge (100) …