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Full-Text Articles in Physical Sciences and Mathematics

On The Electrochemical Etching Of Tips For Scanning Tunneling Microscopy, Nancy Burnham, J. Ibe, P. Bey Jr., S. Brandow, R. Brizzolara, D. Dilella, K. Lee, C. K. Marrian, R. Colton Jun 1990

On The Electrochemical Etching Of Tips For Scanning Tunneling Microscopy, Nancy Burnham, J. Ibe, P. Bey Jr., S. Brandow, R. Brizzolara, D. Dilella, K. Lee, C. K. Marrian, R. Colton

Nancy A. Burnham

The sharpness of tips used in scanning tunneling microscopy(STM) is one factor which affects the resolution of the STM image. In this paper, we report on a direct‐current (dc) drop‐off electrochemicaletching procedure used to sharpen tips for STM. The shape of the tip is dependent on the meniscus which surrounds the wire at the air–electrolyte interface. The sharpness of the tip is related to the tensile strength of the wire and how quickly the electrochemical reaction can be stopped once the wire breaks. We have found that the cutoff time of the etch circuit has a significant effect on the …


Diffuse Absorbing Beryllium Coatings Produced By Magnetron Sputtering, David D. Allred, C. M. Egert Jan 1990

Diffuse Absorbing Beryllium Coatings Produced By Magnetron Sputtering, David D. Allred, C. M. Egert

Faculty Publications

Beryllium coatings with varying thicknesses and columnar grain sizes were deposited by low temperature magnetron sputtering and wet chemically etched to enhance diffuse absorption of light. After etching these coatings exhibited a matte black surface finish and low specular reflectance (below 2%) in the IR up to a critical wavelength dependent upon the original grain size of the coating. Extremely thick coatings (350 µm) with original grain sizes of 10 to 12 µm were produced which exhibited specular reflectances below 0.5% up to 50 µm wavelength and a Lambertian BRDF at 10.6 µm averaging 4.3x10-3 ster-1. Scanning electron micrographs are …