Physical Sciences and Mathematics Commons^™

Parallel Split-Level Relaxation, Thomas C. Henderson, Ashok K. Samal

CSE Conference and Workshop Papers

The goal of the scene labeling problem is to identify a set of regions in a given image. There are several approaches to solve this problem, including backtracking, graph matching, etc. A new method called split-level relaxation based on discrete relaxation was proposed in. It takes care of multiple semantic constraints, by considering each of them independently. The problem is NP-complete, so it takes a long time to solve this problem. With the advent of multiprocessors, it is now imperative to see if the problem can be solved faster in the average case.

We give a framework for solving the …

A Fast Fault Simulation Algorithm For Combinational Circuits, Wuudiann Ke, Sharad C. Seth, Bhargab B. Bhattacharya

CSE Conference and Workshop Papers

The performance of a fast fault simulation algorithm for combinational circuits, such as the critical path tracing method, is determined primarily by the efficiency with which it can deduce the detectability of stem faults (stem analysis). We propose a graph based approach to perform stem analysis. A dynamic data structure, called the criticality constraint graph, is used during the backward pass to carry information related to self masking and multiple-path sensitization of stem faults. The structure is updated in such a way that when stems are reached their criticality can be found by looking at the criticality constraints on their …

Test Generation By Fault Sampling, Vishwani Agrawal, Hassan Farhat, Sharad C. Seth

CSE Conference and Workshop Papers

This paper presents a novel technique of generating tests from a random sample of faults. The entire fault population of the circuit is randomly divided into two groups. Only one group, usually the smaller one, is used for test generation by the test-generator and fault-simulator programs. This group is known as the sample and its coverage is deterministic. The coverage of faults in the remaining group is similar to that of random vectors and is estimated from the distribution of fault detection probabilities in the circuit. As the sample size increases, the fraction of unsampled faults reduces. At the same …

What Is The Path To Fast Fault Simulation?, Miron Abramovici, Balaji Krishnamurthy, Rob Mathews, Bill Rogers, Michael Schulz, Sharad C. Seth, John Waicukauski

School of Computing: Faculty Publications

Motivated by the recent advances in fast fault simulation techniques for large combinational circuits, a panel discussion has been organized for the 1988 International Test Conference. This paper is a collective account of the position statements offered by the panelists.