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Full-Text Articles in Physical Sciences and Mathematics
Atomic Force Microscopy Tip-Enhanced Laser Ablation, Fan Cao
Atomic Force Microscopy Tip-Enhanced Laser Ablation, Fan Cao
LSU Doctoral Dissertations
In the present work, an apertureless atomic force microscope (AFM) tip-enhanced laser ablation (TELA) system was developed and investigated. An AFM was coupled to an optical parametric oscillator (OPO) wavelength tunable laser for sample ablation with a submicron sampling size. The AFM was used to image the surface and hold the AFM tip 10 nm above the sample surface. The AFM tip is coated with a layer of gold with a thickness of 35 nm. The incident laser wavelength was tuned in the visible and near-infrared (IR) region and focused on the AFM tip. With the tip-enhancement effect, ablation craters …
Scanning Probe Microscopy Investigations Of (1) Arrays Of Cysteine-Coated Cds Nanoparticles And (2) Structures Formed During The Early Stages Of The Corrosion Of Copper Surfaces, Brian Robert Lewandowski
Scanning Probe Microscopy Investigations Of (1) Arrays Of Cysteine-Coated Cds Nanoparticles And (2) Structures Formed During The Early Stages Of The Corrosion Of Copper Surfaces, Brian Robert Lewandowski
LSU Doctoral Dissertations
Scanning probe microscopy (SPM) characterizations are becoming more prevalent for surface investigations due to their capabilities for obtaining structural information and physical measurements. New capabilities of SPM for studying and controlling nanoscale processes are emerging as valuable assets in research. A fundamental understanding of the interactions of surface reactions provides essential information for developing workable applications for nanotechnology. Two applications of SPM are discussed in this dissertation. The first investigation uses atomic force microscopy (AFM) for the characterization of nanostructures produced with a newly developed lithographic technique called “two-particle” lithography. This new technique is based on particle lithography for the …