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Physical Sciences and Mathematics Commons

Open Access. Powered by Scholars. Published by Universities.®

Astrophysics and Astronomy

Brigham Young University

Theses/Dissertations

Optical constants

Publication Year

Articles 1 - 3 of 3

Full-Text Articles in Physical Sciences and Mathematics

Extreme Ultraviolet Polarimetry With Laser-Generated High-Order Harmonics: Characterization Of Uranium, Nicole Brimhall Jul 2009

Extreme Ultraviolet Polarimetry With Laser-Generated High-Order Harmonics: Characterization Of Uranium, Nicole Brimhall

Theses and Dissertations

We developed an extreme ultraviolet (EUV) polarimeter, which employs laser-generated high-order harmonics as the light source. This relatively high-flux, directional EUV source has available wavelengths between 10 nm and 47 nm with easily rotatable linear polarization. The polarimeter has allowed us to characterize the optical constants of materials that may be useful for EUV optics. The instrument has a versatile positioning system and a spectral resolution of about 180, and we have demonstrated that reflectance as low as 0.1% can be measured repeatably at EUV wavelengths. We investigate the high harmonic source used for polarimetry measurements by documenting the spatial …


Scandium Oxide Thin Films And Their Optical Properties In The Extreme Ultraviolet, Guillermo Antonio Acosta Nov 2007

Scandium Oxide Thin Films And Their Optical Properties In The Extreme Ultraviolet, Guillermo Antonio Acosta

Theses and Dissertations

This study reports on the physical and optical characterization of scandium oxide thin films. Thin films of scandium oxide, 20-40 nm thick, were deposited on silicon wafers, quartz slides, and silicon photodiodes by reactively sputtering scandium in an oxygen environment. These samples were characterized using ellipsometry, high-resolution transmission electron microscopy, scanning transmission electron microscopy, and energy dispersive x-ray analysis. A 28.46 nm thick scandium oxide thin film was measured in the Extreme Ultraviolet (EUV) from 2.7 to 50 nm (459.3 to 24.8 eV) using synchrotron radiation at the Advanced Light Source Beamline 6.3.2 at the Lawrence Berkeley National Laboratory. In …


Extreme Ultraviolet Polarimetry With Laser-Generated High-Order Harmonics, Nicole Brimhall Jul 2007

Extreme Ultraviolet Polarimetry With Laser-Generated High-Order Harmonics, Nicole Brimhall

Theses and Dissertations

We developed an extreme ultraviolet (EUV) polarimeter, which employs laser-generated high-order harmonics as the light source. This relatively high-flux directional EUV source has available wavelengths between 8 nm and 62 nm and easily rotatable linear polarization. The polarimeter will aid researchers at BYU in characterizing EUV thin films and improving their understanding of materials for use in EUV optics. This first-time workhorse application of laser high harmonics enables polarization-sensitive reflection measurements not previously available in the EUV. We have constructed a versatile positioning system that places harmonics on the microchannel plate detector with an accuracy of 0.3 mm, which allows …