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Full-Text Articles in Physical Sciences and Mathematics

Allometric Extension For Multivariate Regression Models, Thaddeus Tarpey, Christopher T. Ivey Oct 2006

Allometric Extension For Multivariate Regression Models, Thaddeus Tarpey, Christopher T. Ivey

Mathematics and Statistics Faculty Publications

In multivariate regression, interest lies on how the response vector depends on a set of covariates. A multivariate regression model is proposed where the covariates explain variation in the response only in the direction of the first principal component axis. This model is not only parsimonious, but it provides an easy interpretation in allometric growth studies where the first principal component of the log-transformed data corresponds to constants of allometric growth. The proposed model naturally generalizes the two–group allometric extension model to the situation where groups differ according to a set of covariates. A bootstrap test for the model is …


Algebraic Characterizations Of Graph Imbeddability In Surfaces And Pseudosurfaces, Lowell Abrams, Dan Slilaty Jan 2006

Algebraic Characterizations Of Graph Imbeddability In Surfaces And Pseudosurfaces, Lowell Abrams, Dan Slilaty

Mathematics and Statistics Faculty Publications

Given a finite connected graph G and specifications for a closed, connected pseudosurface, we characterize when G can be imbedded in a closed, connected pseudosurface with the given specifications. The specifications for the pseudosurface are: the number of face-connected components, the number of pinches, the number of crosscaps and handles, and the dimension of the first Z2-homology group. The characterizations are formulated in terms of the existence of a dual graph G ∗ on the same set of edges as G which satisfies algebraic conditions inspired by homology groups and their intersection products.


Bias Matroids With Unique Graphical Representations, Dan Slilaty Jan 2006

Bias Matroids With Unique Graphical Representations, Dan Slilaty

Mathematics and Statistics Faculty Publications

Given a 3-connected biased graph Ω with three node-disjoint unbalanced circles, at most one of which is a loop, we describe how the bias matroid of Ω is uniquely represented by Ω.


Electrical Properties Of Unintentionally Doped Semi-Insulating And Conducting 6h-Sic, William C. Mitchel, W. D. Mitchell, Z. Q. Fang, S. R. Smith, Helen Smith, Igor Khlebnikov, Y. I. Khlebnikov, C. Basceri, C. Balkas Jan 2006

Electrical Properties Of Unintentionally Doped Semi-Insulating And Conducting 6h-Sic, William C. Mitchel, W. D. Mitchell, Z. Q. Fang, S. R. Smith, Helen Smith, Igor Khlebnikov, Y. I. Khlebnikov, C. Basceri, C. Balkas

Mathematics and Statistics Faculty Publications

Temperature dependent Hall effect (TDH), low temperature photoluminescence (LTPL), secondary ion mass spectrometry (SIMS), optical admittance spectroscopy (OAS), and thermally stimulated current (TSC) measurements have been made on 6H-SiC grown by the physical vapor transport technique without intentional doping. n- and p-type as well semi-insulating samples were studied to explore the compensation mechanism in semi-insulating high purity SiC. Nitrogen and boron were found from TDH and SIMS measurements to be the dominant impurities that must be compensated to produce semi-insulating properties. The electrical activation energy of the semi-insulating sample determined from the dependence of the resistivity …


On Adaptive Testing In Orthogonal Saturated Designs, Daniel T. Voss, Weizhen Wang Jan 2006

On Adaptive Testing In Orthogonal Saturated Designs, Daniel T. Voss, Weizhen Wang

Mathematics and Statistics Faculty Publications

Adaptive, size-a step-down tests are provided for the analysis of orthogonal saturated designs. The tests work effectively under effect sparsity, and include as special cases the individual nonadaptive tests of Berk and Picard (1991) and the simultaneous nonadaptive tests of Voss (1988). The approach is similar to that used by Wang and Voss (2003) to construct adaptive confidence intervals, but testing is simpler because one can use the same denominator for all statistics. Step-down tests also have a clear power advantage over simultaneous confidence intervals and analogous single-step tests, as is demonstrated theoretically and assessed via simulation.