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Full-Text Articles in Life Sciences
Characteristic Energy Losses With High Energy Electrons Up To 2.5 Mev, B. Jouffrey, J. Sevely, G. Zanchi, Y. Kihn
Characteristic Energy Losses With High Energy Electrons Up To 2.5 Mev, B. Jouffrey, J. Sevely, G. Zanchi, Y. Kihn
Scanning Electron Microscopy
Some aspects of the influence of the energy of the incident electrons in electron energy loss spectroscopy (EELS) are considered. It is shown that this method of analysis used in high voltage electron microscopy, permits one to observe, with a better edge jump ratio than at lower accelerating voltages, the characteristic edges. One important question is to eliminate artefacts in the counting and to record only electrons from the true spectrum. Some recent examples are given. One of them concerns extended energy loss fine structures (EXELFS). It seems high voltage electron microscopy (HVEM) could be very useful in this domain.
Near Edge Fine Structures On Electron Energy Loss Spectroscopy Core Loss Edges, C. Colliex, T. Manoubi, M. Gasgnier, L. M. Brown
Near Edge Fine Structures On Electron Energy Loss Spectroscopy Core Loss Edges, C. Colliex, T. Manoubi, M. Gasgnier, L. M. Brown
Scanning Electron Microscopy
Core edges recorded in Electron Energy Loss Spectroscopy (EELS) display a large variety of profiles. We have investigated several specific aspects concerning Energy Loss Near Edge Structures (ELNES) and emphasize the interest in a careful edge shape analysis to obtain refined microanalytical information, such as local symmetry. After indicating the general impact of EELS fine structures as compared to EDX and Auger spectroscopies we discuss the instrumental conditions required for recording satisfactory spectra and consider the theoretical problems which are involved in data interpretation. The major portion of this paper presents results for selected K, L23, M45 and N45 core …