Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 3 of 3
Full-Text Articles in Engineering
Modeling And Analysis Of Soft-Test/Repair For Ccd-Based Digital X-Ray Systems, Byoungjae Jin, Nohpill Park, Koshy M. George, Minsu Choi, Mark B. Yeary
Modeling And Analysis Of Soft-Test/Repair For Ccd-Based Digital X-Ray Systems, Byoungjae Jin, Nohpill Park, Koshy M. George, Minsu Choi, Mark B. Yeary
Electrical and Computer Engineering Faculty Research & Creative Works
Modern X-ray imaging systems evolve toward digitization for reduced cost, faster time-to-diagnosis, and improved diagnostic confidence. For the digital X-ray systems, charge coupled device (CCD) technology is commonly used to detect and digitize optical X-ray image. This paper presents a novel soft-test/repair approach to overcome the defective pixel problem in CCD-based digital X-ray systems through theoretical modeling and analysis of the test/repair process. There are two possible solutions to cope with the defective pixel problem in CCDs: one is the hard-repair approach and another is the proposed soft-test/repair approach. Hard-repair approach employs a high-yield, expensive reparable CCD to minimize the …
Efficient Contact State Graph Generation For Assembly Applications, Feng Pan, Joseph M. Schimmels
Efficient Contact State Graph Generation For Assembly Applications, Feng Pan, Joseph M. Schimmels
Mechanical Engineering Faculty Research and Publications
An important aspect in the design of many automated assembly strategies is the ability to automatically generate the set of contact states that may occur during an assembly task. In this paper, we present an efficient means of constructing the set of all geometrically feasible contact states that may occur within a bounded set of misalignments (bounds determined by robot inaccuracy). This set is stored as a graph, referred to as an Assembly Contact State Graph (ACSG), which indicates neighbor relationships between feasible states. An ACSG is constructed without user intervention in two stages. In the first stage, all hypothetical …
Calculation Of The Impedance Of A Rectangular Waveguide Aperture In The Presence Of A Loaded Dipole Antenna Embedded In A Generally Lossy Material, Dana M. Hughes, R. Zoughi
Calculation Of The Impedance Of A Rectangular Waveguide Aperture In The Presence Of A Loaded Dipole Antenna Embedded In A Generally Lossy Material, Dana M. Hughes, R. Zoughi
Electrical and Computer Engineering Faculty Research & Creative Works
The use of a combined embedded modulated scattering technique, utilizing a PIN diode-loaded dipole probe, and near-field microwave nondestructive testing technique, utilizing an open-ended rectangular waveguide, has been investigated as a means for determining the complex dielectric constant in which the MST probe is embedded. For this, the formulation of the forward problem of calculating the modulated reflection coefficient, measured at the aperture of the waveguide, is presented here, This formulation is based upon the reciprocity theorem for two antennae, and utilizes the near-field radiation pattern of a rectangular waveguide aperture and current distribution along the length of a dipole …