Engineering Commons^™

Optical And Electron Paramagnetic Resonance Characterization Of Point Defects In Semiconductors, Elizabeth M. Scherrer

Theses and Dissertations

Point defects in two semiconductor materials, both with promising optical properties, are investigated. The first material, CdSiP₂, is a nonlinear optical material in which absorption bands due to point defects can hinder performance when used in frequency conversion applications in the infrared. The second material, Sn₂P₂S₆, is a photorefractive material where point defects with specific properties are needed to optimize response in dynamic holography applications. Electron paramagnetic resonance (EPR) spectroscopy is used to identify the electronic structure of defects and their charge states. Correlations between EPR spectra and optical absorption allow assignments …