Engineering Commons^™

Detecting Special-Cause Variation 'Events' From Process Data Signatures, Timothy M. Young, Olga Khaliukova, Nicolas André, Alexander Petutschnigg, Timothy G. Rials, Chung-Hao Chen

Electrical & Computer Engineering Faculty Publications

The ability to detect the special-cause variation of incoming feedstocks from advanced sensor technology is invaluable to manufacturers. Many on-line sensors produce data signatures that require further off-line statistical processing for interpretation by operational personnel. However, early detection of changes in variation in incoming feedstocks may be imperative to promote early-stage preventive measures. A method is proposed in this applied study for developing control bands to quantify the variation of data signatures in the context of statistical process control (SPC). Control bands based on pointwise prediction intervals constructed from the Bonferroni Inequality and Bayesian smoothing splines are developed. Applications using …