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Elevated Temperature Dependence Of The Anisotropic Visible-To-Ultraviolet Dielectric Function Of Monoclinic Β-Ga2o3, Alyssa Mock, Jeremy Vanderslice, Rafal Korlacki, John A. Woollam, Mathias Schubert
Elevated Temperature Dependence Of The Anisotropic Visible-To-Ultraviolet Dielectric Function Of Monoclinic Β-Ga2o3, Alyssa Mock, Jeremy Vanderslice, Rafal Korlacki, John A. Woollam, Mathias Schubert
Department of Electrical and Computer Engineering: Faculty Publications
We report on the temperature dependence of the dielectric tensor elements of n-type conductive β-Ga2O3 from 22 °C to 550 °C in the spectral range of 1.5 eV–6.4 eV. We present the temperature dependence of the excitonic and band-to-band transition energy parameters using a previously described eigendielectric summation approach [A. Mock et al., Phys. Rev. B 96, 245205 (2017)]. We utilize a Bose-Einstein analysis of the temperature dependence of the observed transition energies and reveal electron coupling with average phonon temperature in excellent agreement with the average over all longitudinal phonon plasmon coupled modes reported previously [M. …
Anisotropy And Phonon Modes From Analysis Of The Dielectric Function Tensor And The Inverse Dielectric Function Tensor Of Monoclinic Yttrium Orthosilicate, Alyssa Mock, Rafal Korlacki, Sean Knight, Mathias Schubert
Anisotropy And Phonon Modes From Analysis Of The Dielectric Function Tensor And The Inverse Dielectric Function Tensor Of Monoclinic Yttrium Orthosilicate, Alyssa Mock, Rafal Korlacki, Sean Knight, Mathias Schubert
Department of Electrical and Computer Engineering: Faculty Publications
We determine the frequency dependence of the four independent Cartesian tensor elements of the dielectric function for monoclinic symmetry Y2SiO5 using generalized spectroscopic ellipsometry from 40–1200 cm−1. Three different crystal cuts, each perpendicular to a principle axis, are investigated. We apply our recently described augmentation of lattice anharmonicity onto the eigendielectric displacement vector summation approach [A.Mock et al., Phys. Rev. B 95, 165202 (2017)], and we present and demonstrate the application of an eigendielectric displacement loss vector summation approach with anharmonic broadening. We obtain an excellent match between all measured and model-calculated dielectric …