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Data Driven Feed Forward Adaptive Testing, Chaitrali Santosh Chandorkar

Dissertations and Theses

Test cost is a critical component in the overall cost of the product. Test cost varies in direct proportion with test time. This thesis introduces a data driven feed forward adaptive technique for reducing test time at wafer sort while maintaining the product defect level. Test data from first insertion of wafer is statistically analyzed to make a decision about adaptive test flow at subsequent insertions.

The data driven feed forward technique uses a statistical screen to analyze test data from first probe of wafer and provides recommendations for test elimination at second insertions. At the second insertion dies are …