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Indoor Localisation Using A Context-Aware Dynamic Position Tracking Model, Montserrat Ros, Joshua Boom, Gavin De Hosson, Matthew D'Souza
Indoor Localisation Using A Context-Aware Dynamic Position Tracking Model, Montserrat Ros, Joshua Boom, Gavin De Hosson, Matthew D'Souza
Dr Montserrat Ros
This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Indoor wireless localisation is a widely sought feature for use in logistics, health, and social networking applications. Low-powered localisation will become important for the next generation of pervasive media applications that operate on mobile platforms. We present an inexpensive and robust context-aware tracking system that can track the position of users in an indoor environment, using a wireless smart meter network. Our context-aware tracking system combines wireless trilateration with a …
A Physical Model For The Kink Effect In Inalas/Ingaas Hemt’S, Mark Somerville, Alexander Ernst, Jesus Del Alamo
A Physical Model For The Kink Effect In Inalas/Ingaas Hemt’S, Mark Somerville, Alexander Ernst, Jesus Del Alamo
Mark Somerville
We present a new model for the the kink effect in InAlAs/InGaAs HEMTs. The model suggests that the kink is due to a threshold voltage shift which arises from a hole pile-up in the extrinsic source and an ensuing charging ofthe surface and/or the buffer-substrate interface. The model captures many of the observed behaviors of the kink, including the kink's dependence on bias, time, temperature, illumination, and device structure. Using the model, we have developed a simple equivalent circuit, which reproduced well the kink's dc characteristics, its time evolution in the nanosecond range, and its dependence on illumination.
A New Approximate Model For Microscopy Imaging, Heidy Sierra, Dana Brooks, Charles Dimarzio
A New Approximate Model For Microscopy Imaging, Heidy Sierra, Dana Brooks, Charles Dimarzio
Charles A. DiMarzio
There has been increasing interest in recent years in techniques for microscopic examination of optically thick transparent objects. A number of phase imaging modalities have been developed to address this need. If a stack of images is acquired through focusing, the image at a given focal plane is contaminated by out-of-focus information coming from other planes [1]. There is a need to develop 3D imaging models for phase microscopes that will allow deconvolution, or more generally inverse reconstruction, techniques to be developed. Thus there is a need for an image formation model for phase microscopy that is able to maintain …