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Full-Text Articles in Engineering

Monocular Passive Ranging By An Optical System With Band Pass Filtering, Joel R. Anderson Mar 2010

Monocular Passive Ranging By An Optical System With Band Pass Filtering, Joel R. Anderson

Theses and Dissertations

An instrument for monocular passive ranging based on atmospheric oxygen absorption near 762 nm has been designed, built and deployed to track emissive targets, including the plumes from jet engines or rockets. An intensified CCD array is coupled to variable band pass liquid crystal display filter and 3.5 – 8.8 degree field of view optics to observe the target. By recording sequential images at 7 Hz in three 6 nm width bands, the transmittance of the R-branch of the O2 (X-b) (0,0) band is determined. A metric curve for determining range from transmittance is developed using the HITRAN spectral …


Rubidium Recycling In A High Intensity Short Duration Pulsed Alkali Laser, Wooddy S. Miller Mar 2010

Rubidium Recycling In A High Intensity Short Duration Pulsed Alkali Laser, Wooddy S. Miller

Theses and Dissertations

Laser induced fluorescence was used to study how pump pulse duration and alkali recycle time effects maximum power output in a Diode Pumped Alkali Laser (DPAL) system. A high intensity short pulsed pump source was used to excited rubidium atoms inside a DPAL-type laser. The maximum output power of the laser showed a strong dependence upon the temporal width of the pump pulse in addition to the input pump intensity. A linear relationship was observed between the maximum output power and the pulse width due to the effective lifetime of the excited state, defined as the time it takes for …


Afm-Patterned 2-D Thin-Film Photonic Crystal Analyzed By Complete Angle Scatter, Nicholas C. Herr Mar 2010

Afm-Patterned 2-D Thin-Film Photonic Crystal Analyzed By Complete Angle Scatter, Nicholas C. Herr

Theses and Dissertations

The purpose of this research was to use an atomic force microscope (AFM) to generate a 2-D square array of sub-wavelength surface features from a single material over a region large enough to permit optical characterization. This work is an extension of previous AFIT nano-patterning work and is in response to the small subunit sizes demanded for the production of optical metamaterials and photonic crystals. A diamond nano-indentation AFM probe was used to produce a 325-μm by 200-μm array of indentations in a 120-nm thick polystyrene film deposited on silicon. Indentation spacing of 400 nm produced well-defined surface features with …


Optical And Electrical Characterization Of Bulk Grown Indium-Gallium-Arsenide Alloys, Austin C. Bergstrom Mar 2010

Optical And Electrical Characterization Of Bulk Grown Indium-Gallium-Arsenide Alloys, Austin C. Bergstrom

Theses and Dissertations

Advances in crystal growth techniques have allowed increased quality in growth of bulk ternary InxGa1-xAs. Here, the optical and electrical properties of samples grown through the vertical Bridgman (or multi-component zone melting growth) method have been investigated through photoluminescence spectroscopy and Hall effect measurements. Indium mole fractions varied from 0.75 for 1. Hall effect measurements at temperatures ranging from 10 to 300 K revealed moderate n-type doping with carrier concentrations ranging from 1.5 to 9.6×1016 cm-3 at 10 to 15 K. Carriers from deep donor levels became appreciable between 50 and 100 K. Hall …


Digital Delay Device, Guna Seetharaman, Paul E. Kladitis Mar 2010

Digital Delay Device, Guna Seetharaman, Paul E. Kladitis

AFIT Patents

A digitally controlled optical delay apparatus providing optical signal delays electrically selectable in the picosecond to nanosecond range by way of selectable signal path lengths. Path lengths are incremented in physical length and path delay time according to digital ratios. The delay element includes micro-miniature path changing mirrors controlled in path length selecting positioning by input signals of logic level magnitude. Fiber optic coupling of signals to and from the delay element and a combination of fixed position and movable mirror included optical signal path lengths are included.