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Full-Text Articles in Engineering
Dynamic Maximum Power Point Tracking Of Photovoltaic Arrays Using Ripple Correlation Control, Trishan Esram, Jonathan W. Kimball, Philip T. Krein, Patrick L. Chapman, Pallab Midya
Dynamic Maximum Power Point Tracking Of Photovoltaic Arrays Using Ripple Correlation Control, Trishan Esram, Jonathan W. Kimball, Philip T. Krein, Patrick L. Chapman, Pallab Midya
Electrical and Computer Engineering Faculty Research & Creative Works
A dynamically rapid method used for tracking the maximum power point of photovoltaic arrays, known as ripple correlation control, is presented and verified against experiment. The technique takes advantage of the signal ripple, which is automatically present in power converters. The ripple is interpreted as a perturbation from which a gradient ascent optimization can be realized. The technique converges asymptotically at maximum speed to the maximum power point without the benefit of any array parameters or measurements. The technique has simple circuit implementations.
Signal Link-Path Characterization Up To 20 Ghz Based On A Stripline Structure, Jianmin Zhang, James L. Drewniak, David Pommerenke, Richard E. Dubroff, Zhiping Yang, Wheling Cheng, John C. Fisher, Sergio Camerlo
Signal Link-Path Characterization Up To 20 Ghz Based On A Stripline Structure, Jianmin Zhang, James L. Drewniak, David Pommerenke, Richard E. Dubroff, Zhiping Yang, Wheling Cheng, John C. Fisher, Sergio Camerlo
Electrical and Computer Engineering Faculty Research & Creative Works
Dielectric properties and losses are two critical issues in signal link-path characterization. To obtain the substrate dielectric properties for a planar transmission line, an analytical solution is derived and validated based on a stripline structure and measured scattering parameters with TRL de-embedding. The characterized dielectric property is used to evaluate dielectric loss and conductor loss. The total loss is thereby found from their summation. The calculated total loss is compared to the measured total loss, and the conductor loss and dielectric loss are then quantifiable. Since the conventional description using the loss tangent and dielectric constant to represent material properties …
Cost-Driven Repair Of A Nanowire Crossbar Architecture, Yadunandana Yellambalase, Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi
Cost-Driven Repair Of A Nanowire Crossbar Architecture, Yadunandana Yellambalase, Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi
Electrical and Computer Engineering Faculty Research & Creative Works
The recent development of nanoscale materials and assembly techniques has resulting in the manufacturing of high-density computational systems. These systems consist of nanometer-scale elements and are likely to have many manufacturing imperfections (defects); thus, defect-tolerance is considered as one of the most some algorithms for repairing defective crosspoints in a nanoscale crossbar architecture; furthermore we estimate the efficiency and cost-effectiveness of each algorithm. Also, for a given design and manufacturing environment, we propose a cost-driven method to find a balanced solution by which figures of merit such as area, repair time and reconfiguration cost can be taken into account. Probabilistic …
High Accuracy Disbond Thickness Estimation Scheme Employing Multiple-Frequency Near-Field Microwave Measurements, Mohamed A. Abou-Khousa, R. Zoughi
High Accuracy Disbond Thickness Estimation Scheme Employing Multiple-Frequency Near-Field Microwave Measurements, Mohamed A. Abou-Khousa, R. Zoughi
Electrical and Computer Engineering Faculty Research & Creative Works
Microwave nondestructive evaluation (NDE) techniques have shown great potential for disbond detection in multi-layer dielectric structures. However, a quantitative disbond thickness estimation scheme has not been introduced yet. In this paper, we propose a maximum-likelihood (ML) disbond thickness estimation scheme utilizing multiple independent measurements obtained at different frequencies. By simulations and experiments, we show that the proposed scheme produces highly accurate disbond thickness estimates.
Extraction Of Dispersive Material Parameters Using Vector Network Analyzers And Genetic Algorithms, Jianmin Zhang, Marina Koledintseva, David Pommerenke, James L. Drewniak, Konstantin Rozanov, Giulio Antonini, Antonio Orlandi
Extraction Of Dispersive Material Parameters Using Vector Network Analyzers And Genetic Algorithms, Jianmin Zhang, Marina Koledintseva, David Pommerenke, James L. Drewniak, Konstantin Rozanov, Giulio Antonini, Antonio Orlandi
Electrical and Computer Engineering Faculty Research & Creative Works
A novel method to extract dispersive properties for dielectrics over a wide frequency range is proposed. This method is based on measuring scattering parameters for planar transmission lines and applying genetic algorithms. The scattering parameters are converted into ABCD matrix parameters. The complex propagation constant of the TEM wave inside the line is obtained from A-parameters of the ABCD matrix. For planar transmission lines, analytical or empirical formulas for dielectric loss,conductor loss, anaphase constant are known. The genetic algorithm is then used to extract the Debye parameters for the dielectric substrates. FDTD modeling is used to verify the dispersive parameter …