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Programmable Latching Probe Microstructures For Wafer Testing Applications, Salima Taifa Sadeq

Theses

The objective of this thesis is to design a programmable wafer testing array on a single chip based on micro electromechanical systems (MEMS) and VLSI. The wafer-scale integration in this thesis is a programmable array of test probes that are used for engineering test of VLSI and ULSI silicon integrated circuits at the wafer level. This consists of two subsystems (1) the VLSI address circuits used for addressing and controlling the MEMS on the chip and (2) the latching probe MEMS microstructure array that actuates into position for testing VLSI wafers. Each of the subsystems have been designed, analyzed and …