Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 2 of 2
Full-Text Articles in Engineering
Reference Architecture For Machine Control Systems Integration: Interim Report, M Senehi, Thomas Kramer, John Michaloski, Richard Quintero, Steven Ray, William Rippey, Sarah Wallace
Reference Architecture For Machine Control Systems Integration: Interim Report, M Senehi, Thomas Kramer, John Michaloski, Richard Quintero, Steven Ray, William Rippey, Sarah Wallace
Steven R Ray
No abstract provided.
Accounting For The Stiffnesses Of The Probe And Sample In Scanning Probe Microscopy*, Nancy Burnham
Accounting For The Stiffnesses Of The Probe And Sample In Scanning Probe Microscopy*, Nancy Burnham
Nancy A. Burnham
The elements of a scanning probe microscope are modeled as a set of springs in series. For a single‐component sample, that is, a sample consisting of only one material, the detected feature height in variable force (force microscopy) or variable current (tunneling microscopy) modes is a function of the total system stiffness and the stiffness of the detector. For a multicomponent sample, the data in both variable force (current) and constant force (current) modes are modified by the set‐point force, the detector stiffness, and the relative stiffnesses of the components of the sample. A detection scheme for reducing this compliance …