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Articles 1 - 6 of 6
Full-Text Articles in Engineering
Phonon Transport Analysis Of Semiconductor Nanocomposites Using Monte Carlo Simulations, Mayank Malladi
Phonon Transport Analysis Of Semiconductor Nanocomposites Using Monte Carlo Simulations, Mayank Malladi
All Theses
Nanocomposites are composite materials which incorporate nanosized particles, platelets or fibers. The addition of nanosized phases into the bulk matrix can lead to significantly different material properties compared to their macrocomposite counterparts. For nanocomposites, thermal conductivity is one of the most important physical properties. Manipulation and control of thermal conductivity in nanocomposites have impacted a variety of applications. In particular, it has been shown that the phonon thermal conductivity can be reduced significantly in nanocomposites due to the increase in phonon interface scattering while the electrical conductivity can be maintained. This extraordinary property of nanocomposites has been used to enhance …
Fluorescence Characterization Of Quantum Dots For Use As Biomarkers, Logan M. Grimes
Fluorescence Characterization Of Quantum Dots For Use As Biomarkers, Logan M. Grimes
Materials Engineering
Fluorescence profiles of quantum dots (QDs) were characterized to select the ideal QDs for encapsulation in phospholipids for use as biomarkers to selectively adhere to cancer cells. QDs were synthesized and extracted 0, 30, 60, and 90 seconds after precursor compounds were mixed. These extractions were isolated by extraction time. Portions from each vial were coated in a zinc sulfide shelling procedure, leaving at least half of the QD solution unshelled. These samples were characterized over four days to monitor fluctuations in fluorescence. This was done utilizing an Ocean Optics spectrometer in conjunction with Spectra Suite software. The central wavelength, …
Ultrafast Laser Material Processing For Photonic Applications, Mark Ramme
Ultrafast Laser Material Processing For Photonic Applications, Mark Ramme
Electronic Theses and Dissertations
Femtosecond Laser Direct Writing (FLDW) is a viable technique for producing photonic devices in bulk materials. This novel manufacturing technique is versatile due to its full 3D fabrication capability. Typically, the only requirement for this process is that the base material must be transparent to the laser wavelength. The modification process itself is based on non-linear energy absorption of laser light within the focal volume of the incident beam. This thesis addresses the feasibility of this technique for introducing photonic structures into novel dielectric materials. Additionally, this work provides a deeper understanding of the lightmatter interaction mechanism occurring at high …
Crystal Growth, Characterization And Fabrication Of Cdznte-Based Nuclear Detectors, Ramesh Madhu Krishna
Crystal Growth, Characterization And Fabrication Of Cdznte-Based Nuclear Detectors, Ramesh Madhu Krishna
Theses and Dissertations
In today's world, nuclear radiation is seeing more and more use by humanity as time goes on. Nuclear power plants are being built to supply humanity's energy needs, nuclear medical imaging is becoming more popular for diagnosing cancer and other diseases, and control of weapons-grade nuclear materials is becoming more and more important for national security. All of these needs require high-performance nuclear radiation detectors which can accurately measure the type and amount of radiation being used. However, most current radiation detection materials available commercially require extensive cooling, or simply do not function adequately for high-energy gamma-ray emitting nuclear materials …
Mueller Based Scatterometry And Optical Characterization Of Semiconductor Materials, Gangadhara Raja Muthinti
Mueller Based Scatterometry And Optical Characterization Of Semiconductor Materials, Gangadhara Raja Muthinti
Legacy Theses & Dissertations (2009 - 2024)
Scatterometry is one of the most useful metrology methods for the characterization and control of critical dimensions (CD) and the detailed topography of periodic structures found in microelectronics fabrication processes. Spectroscopic ellipsometry (SE) and normal incidence reflectometry (NI) based scatterometry are the most widely used optical methodologies for metrology of these structures. Evolution of better optical hardware and faster computing capabilities led to the development of Mueller Matrix (MM) based Scatterometry (MMS). Dimensional metrology using full Mueller Matrix (16 element) scatterometry in the wavelength range of 245nm-1000nm was discussed in this work. Unlike SE and NI, MM data provides complete …
Understanding Defect Interactions In Si Ultra-Shallow P-N Junctions Formed By Very Low Energy Boron Implantation, Lakshmanan H. Vanamurthy
Understanding Defect Interactions In Si Ultra-Shallow P-N Junctions Formed By Very Low Energy Boron Implantation, Lakshmanan H. Vanamurthy
Legacy Theses & Dissertations (2009 - 2024)
One of the biggest challenges in the scaling of CMOS devices is the formation of a highly activated, abrupt, defect free Source drain extension (SDE) region. This is especially difficult with p-FET's because of the (1) Boron diffusion co-efficient enhancement from Transient enhanced diffusion (TED) and (2) low solid solubility of