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Full-Text Articles in Engineering
Chaos-Based Coffee Can Radar System, Conor Willsie, Rong Chen
Chaos-Based Coffee Can Radar System, Conor Willsie, Rong Chen
Honors Theses
Linear frequency modulated (LFM) radar systems are simple and easy to implement, making them ideal for inexpensive undergraduate research projects. Unfortunately, LFM radar schemes have multiple limitations that make them unviable in many real-world applications. Given the limitations of LFM radar systems, we propose a chaos-based frequency modulated (CBFM) system. In this paper, we present the theory, design, and experimental verification of a CBFM radar system that has both ranging and synthetic aperture radar imaging capabilities. The performance of our CBFM system is compared to that of the LFM system designed by MIT. We document many challenges and unforeseen obstacles …
2018 Ieee Signal Processing Cup: Forensic Camera Model Identification Challenge, Michael Geiger
2018 Ieee Signal Processing Cup: Forensic Camera Model Identification Challenge, Michael Geiger
Honors Theses
The goal of this Senior Capstone Project was to lead Union College’s first ever Signal Processing Cup Team to compete in IEEE’s 2018 Signal Processing Cup Competition. This year’s competition was a forensic camera model identification challenge and was divided into two separate stages of competition: Open Competition and Final Competition. Participation in the Open Competition was open to any teams of undergraduate students, but the Final Competition was only open to the three finalists from Open Competition and is scheduled to be held at ICASSP 2018 in Calgary, Alberta, Canada. Teams that make it to the Final Competition will …
Coupling Of Audio Signals Into Afm Images, Matthew Manning
Coupling Of Audio Signals Into Afm Images, Matthew Manning
Honors Theses
It is well known that Atomic Force Microscopy imaging is capable of yielding high resolution results with of surfaces at the nanoscale. However, despite the device capabilities and vast applications, AFM microscopy is possibly the most prone to the creation of image artifacts. AFM imaging can easily, and is often, corrupted by various external forces. The most obvious and measurable form of external interference is of course the presence of ambient noise. Most AFM manufactures attempt to counter the effects of such noise on the imaging process through use of noise-proof or noise-resistant shields that cover the microscope aperture. Without …