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2016

Reliability

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Full-Text Articles in Engineering

Condition Factor Calibration For Load And Resistance Factor Rating Of Steel Girder Bridges, Pranav M. Shakya Dec 2016

Condition Factor Calibration For Load And Resistance Factor Rating Of Steel Girder Bridges, Pranav M. Shakya

Department of Civil and Environmental Engineering: Dissertations, Theses, and Student Research

The Load and Resistance Factor Rating (LRFR) is a reliability-based rating procedure complementary to the Load and Resistance Factor Design (LRFD). The intent of LRFR is to provide consistent reliability for all bridges regardless of in-situ condition. The primary difference between design and rating is the uncertain severity and location of deterioration, including the potential future loss of strength for an element already evidencing deterioration. Ostensibly, these uncertainties are accounted for by applying an additional strength reduction factor: the condition factor, ϕc. Currently, condition factors are nominally correlated to the condition of the member, which can be Good, …

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Survival Analyses For Bridge Decks In Northern United States, Habib Tabatabai, Chin-Wei Lee, Mohammad A. Tabatabai Jun 2016

Survival Analyses For Bridge Decks In Northern United States, Habib Tabatabai, Chin-Wei Lee, Mohammad A. Tabatabai

Civil and Environmental Engineering Faculty Articles

The use of deicing salts in northern regions of the United States is a major contributor to the long-term deterioration of bridge decks. In this study, the 2008 U.S. National Bridge Inventory (NBI) records were used to develop survival models for non-reconstructed bridge decks in six northern states of Minnesota, Wisconsin, Michigan, Ohio, Pennsylvania, and New York. The hypertabastic accelerated failure model was used to develop survival (reliability) and hazard (failure rate) functions for all six states. The NBI parameters included were the deck rating, type of superstructure (concrete or steel), deck surface area, age, and average daily traffic (ADT). …

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Benefits Of Considering More Than Temperature Acceleration For Gan Hemt Life Testing, Ronald A. Coutu Jr., Robert A. Lake, Bradley D. Christiansen, Eric R. Heller, Christopher A. Bozada, Brian S. Poling, Glen D. Via, James P. Theimer, Stephen E. Tetlak, Ramakrishna Vetury, Jeffrey B. Shealy Jun 2016

Benefits Of Considering More Than Temperature Acceleration For Gan Hemt Life Testing, Ronald A. Coutu Jr., Robert A. Lake, Bradley D. Christiansen, Eric R. Heller, Christopher A. Bozada, Brian S. Poling, Glen D. Via, James P. Theimer, Stephen E. Tetlak, Ramakrishna Vetury, Jeffrey B. Shealy

Electrical and Computer Engineering Faculty Research and Publications

The purpose of this work was to investigate the validity of Arrhenius accelerated-life testing when applied to gallium nitride (GaN) high electron mobility transistors (HEMT) lifetime assessments, where the standard assumption is that only critical stressor is temperature, which is derived from operating power, device channel-case, thermal resistance, and baseplate temperature. We found that power or temperature alone could not explain difference in observed degradation, and that accelerated life tests employed by industry can benefit by considering the impact of accelerating factors besides temperature. Specifically, we found that the voltage used to reach a desired power dissipation is important, and …

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Benefits Of Considering More Than Temperature Acceleration For Gan Hemt Life Testing, Ronald A. Coutu Jr., Robert A. Lake, Bradley D. Christiansen, Eric R. Heller, Christopher A. Bozada, Brian S. Poling, Glen D. Via, James P. Theimer, Stephen E. Tetlak, Ramakrishna Vetury, Jeffrey B. Shealy Jun 2016

Benefits Of Considering More Than Temperature Acceleration For Gan Hemt Life Testing, Ronald A. Coutu Jr., Robert A. Lake, Bradley D. Christiansen, Eric R. Heller, Christopher A. Bozada, Brian S. Poling, Glen D. Via, James P. Theimer, Stephen E. Tetlak, Ramakrishna Vetury, Jeffrey B. Shealy

Faculty Publications

The purpose of this work was to investigate the validity of Arrhenius accelerated-life testing when applied to gallium nitride (GaN) high electron mobility transistors (HEMT) lifetime assessments, where the standard assumption is that only critical stressor is temperature, which is derived from operating power, device channel-case, thermal resistance, and baseplate temperature. We found that power or temperature alone could not explain difference in observed degradation, and that accelerated life tests employed by industry can benefit by considering the impact of accelerating factors besides temperature. Specifically, we found that the voltage used to reach a desired power dissipation is important, and …

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Effect Of Fiber Reinforcement On Cbr Behavior Of Lime Blended Expansive Soils: Reliability Approach, Arif Ali Baig Moghal, B. Munwar Basha, Bhaskar Chittoori, Mosleh Ali Al-Shamrani Jan 2016

Effect Of Fiber Reinforcement On Cbr Behavior Of Lime Blended Expansive Soils: Reliability Approach, Arif Ali Baig Moghal, B. Munwar Basha, Bhaskar Chittoori, Mosleh Ali Al-Shamrani

Civil Engineering Faculty Publications and Presentations

Use of synthetic fibers as reinforcement to stabilize expansive soils is gaining momentum. As a contribution towards this growing field of research two different types of synthetic fibers, Fiber Mesh® and Fiber Cast®, were evaluated as a stabilization alternative for expansive soils in the presence of lime. California Bearing Ratio (CBR) is chosen as a performance indicator as it is a good pointer towards pavement effectiveness. Variables such as length and amount of the fibers as well as curing period were studied. Both deterministic and probabilistic (or reliability) analysis is presented in this paper. While the deterministic analysis helps in …

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