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An Optimal Algorithm For Detecting Pattern Sensitive Faults In Semiconductor Random Access Memories, Richard I. Subrin
An Optimal Algorithm For Detecting Pattern Sensitive Faults In Semiconductor Random Access Memories, Richard I. Subrin
Retrospective Theses and Dissertations
Random-access memory (RAM) testing to detect unrestricted pattern-sensitive faults (PSFs) is impractical due to the size of the memory checking sequence required. A formal model for restricted PSFs in RAMs called adjacent-pattern interference faults (APIFs) is presented. A test algorithm capable of detecting APIFs in RAMs requiring a minimum number of memory operations is then developed.