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Design Of Film-Substrate Single-Reflection Linear Partial Polarizers, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Design Of Film-Substrate Single-Reflection Linear Partial Polarizers, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
The results of a preceding paper [J. Opt. Soc. Am. 65, 1464,(1975)] are viewed from a different angleas providing the basis for the design of film-substrate single-reflection linear partial polarizers (LPP),which also operate as reflection optical rotators. The important characteristics of a comprehensive set of discrete designs of SiO2-Si LPP’s at λ = 6328 Å are shown graphically.
Polarizer-Surface-Analyzer Null Ellipsometry For Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Polarizer-Surface-Analyzer Null Ellipsometry For Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
Single-pass polarizer-surface-analyzer null ellipsometry (PSA-NE) can be used to characterize film-substrate systems, provided that the film thickness lies within one of a set of permissible-thickness bands (PTB). For a transparent film on a transparent or absorbing substrate, the PTB structure consists of a small number of finite-bandwidth bands followed by a continuum band that extends from a film thickness of about half the wavelength of light to infinity. We show that this band structure is a direct consequence of the periodicity of the ellipsometric function ρ (the ratio Rp/Rs, of the complex amplitude-reflection coefficients for …
Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara
Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
The design steps for film—substrate single-reflection retarders are briefly stated and applied to the SiO2—Si film—substrate system at wavelength 6328 Å. The criterion of minimum-maximum error of the ellipsometric angle ψ is used to choose angle-of-incidence-tunable designs. Use is made of the (Φ-d) plane (angle of incidence versus thickness) to determine whether a given film—substrate system with known optical properties and film thickness can operate as a reflection retarder and to determine the associated angles of incidence and retardation angles. This leads to the concept of permissible-thickness bands and forbidden gaps for operation of a film—substrate …
Combined Reflection And Transmission Thin-Film Ellipsometry: A Unified Linear Analysis, Rasheed M.A. Azzam, M. Elshazly-Zaghloul, N. M. Bashara
Combined Reflection And Transmission Thin-Film Ellipsometry: A Unified Linear Analysis, Rasheed M.A. Azzam, M. Elshazly-Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
A scheme of combined reflection and transmission ellipsometry on light-transmitting ambient-film-substrate systems is proposed and the required sample design and instrument operation are investigated. A comparative study of the sensitivity of external and internal reflection and transmission ellipsometry is carried out based on unified linear approximations of the exact equations. These approximations are general in that an arbitrary initial film thickness is assumed. They are simple, because a complex sensitivity function is introduced whose real and imaginary projections determine the psi (Ψ) and delta (Δ) sensitivity factors. Among the conclusions of this paper are the following. (1) External reflection ellipsometry …
Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara
Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
No abstract provided.
Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
The ratio ρ = Rp/Rs of the complex amplitude-reflection coefficients Rp and Rs for light polarized parallel (p) and perpendicular (s) to the plane of incidence, reflected from an optically isotropic film-substrate system, is investigated as a function of the angle of incidence ϕ and the film thickness d. Both constant-angle-of-incidence contours (CAIC) and constant-thickness contours (CTC) of the ellipsometric function ρ(ϕ,d) in the complex ρ plane are examined. For transparent films, ρ(ϕ,d) is a periodic function of d with period Dϕ that is a function of ϕ. …