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Secondary Electron Yield Measurements On Materials Of Interest To Vacuum Electron Communication Devices, Talal Ahmed Malik
Secondary Electron Yield Measurements On Materials Of Interest To Vacuum Electron Communication Devices, Talal Ahmed Malik
Electrical and Computer Engineering ETDs
Microwave vacuum electron devices are a critical part of communication satellite payloads. The phenomenon of multipactor breakdown (MPB) can cause the performance of these devices to deteriorate, including their partial or total destruction. MPB depends on a number of factors, including the secondary electron yield (SEY) of materials used within the device. The process of electron multiplication, which leads to breakdown, initiates with the impact of primary electrons on target surfaces, and the resonance of free electrons within an oscillating electromagnetic field under vacuum conditions. Therefore, it is of interest to find materials and surface treatment methods that exhibit low …