Open Access. Powered by Scholars. Published by Universities.®
- Discipline
-
- Physical Sciences and Mathematics (9)
- Physics (8)
- Biomedical Engineering and Bioengineering (5)
- Electrical and Computer Engineering (4)
- Engineering Physics (4)
-
- Electrical and Electronics (3)
- Chemical Engineering (2)
- Materials Science and Engineering (2)
- Other Chemical Engineering (2)
- Chemistry (1)
- Electromagnetics and Photonics (1)
- Medicine and Health Sciences (1)
- Optics (1)
- Other Electrical and Computer Engineering (1)
- Other Materials Science and Engineering (1)
- Semiconductor and Optical Materials (1)
- Publication
- File Type
Articles 1 - 12 of 12
Full-Text Articles in Engineering
Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal
Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal
Krishna C. Mandal
No abstract provided.
Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal
Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal
Krishna C. Mandal
No abstract provided.
Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal
Investigation Of Cdznte Crystal Defects Using Scanning Probe Microscopy, Goutam Koley, J. Liu, K. C. Mandal
Krishna C. Mandal
No abstract provided.
Data Management And Visualization Of X-Ray Diffraction Spectra From Thin Film Ternary Composition Spreads, I. Takeuchi, C. Long, O. Famodu, M. Murakami, Jason Hattrick-Simpers, G. Rubloff, M. Stukowski, K. Rajan
Data Management And Visualization Of X-Ray Diffraction Spectra From Thin Film Ternary Composition Spreads, I. Takeuchi, C. Long, O. Famodu, M. Murakami, Jason Hattrick-Simpers, G. Rubloff, M. Stukowski, K. Rajan
Jason R. Hattrick-Simpers
We discuss techniques for managing and visualizing x-ray diffraction spectrum data for thin film composition spreads which map large fractions of ternary compositional phase diagrams. An in-house x-ray microdiffractometer is used to obtain spectra from over 500 different compositions on an individual spread. The MATLAB software is used to quickly organize the data and create various plots from which one can quickly grasp different information regarding structural and phase changes across the composition spreads. Such exercises are valuable in rapidly assessing the “overall” picture of the structural evolution across phase diagrams before focusing in on specific composition regions for detailed …
Applications Of High Throughput (Combinatorial) Methodologies To Electronic, Magnetic, Optical, And Energy-Related Materials, Martin L. Green, Ichiro Takeuchi, Jason R. Hattrick-Simpers
Applications Of High Throughput (Combinatorial) Methodologies To Electronic, Magnetic, Optical, And Energy-Related Materials, Martin L. Green, Ichiro Takeuchi, Jason R. Hattrick-Simpers
Jason R. Hattrick-Simpers
High throughput (combinatorial) materials science methodology is a relatively new research paradigm that offers the promise of rapid and efficient materials screening, optimization, and discovery. The paradigm started in the pharmaceutical industry but was rapidly adopted to accelerate materials research in a wide variety of areas. High throughput experiments are characterized by synthesis of a “library” sample that contains the materials variation of interest (typically composition), and rapid and localized measurement schemes that result in massive data sets. Because the data are collected at the same time on the same “library” sample, they can be highly uniform with respect to …
Luminescence Mechanisms In Quaternary AlXInYGa1-X-YN Materials, Mee-Yi Ryu, C. Q. Chen, E. Kuokstis, J. W. Yang, Grigory Simin, M. Asif Khan
Luminescence Mechanisms In Quaternary AlXInYGa1-X-YN Materials, Mee-Yi Ryu, C. Q. Chen, E. Kuokstis, J. W. Yang, Grigory Simin, M. Asif Khan
Grigory Simin
Low-temperature photoluminescence investigations have been carried out in the quaternary AlInGaN epilayers and AlInGaN/AlInGaN multiple quantum wells (MQWs) grown by pulsedmetalorganic chemical-vapor deposition (PMOCVD). With increasing excitation power density, the emission peaks in both AlInGaN epilayers and MQWs show a strong blueshift and theirlinewidths increase. The luminescence of the samples grown by PMOCVD is attributed to recombination of carriers/excitons localized at band-tail states. We also demonstrate theluminescence properties of AlInGaN and AlGaN materials grown by a pulsed atomic-layerepitaxy and conventional MOCVD, respectively.
Implantable Polymer/Metal Thin Film Structures For The Localized Treatment Of Cancer By Joule Heating, Nima Rahbar, Kwabena Kan-Dapaah, Christian Theriault, Wole Soboyejo
Implantable Polymer/Metal Thin Film Structures For The Localized Treatment Of Cancer By Joule Heating, Nima Rahbar, Kwabena Kan-Dapaah, Christian Theriault, Wole Soboyejo
Nima Rahbar
This paper presents an implantable polymer/metal alloy thin film structure for localized post-operative treatment of breast cancer. A combination of experiments and models is used to study the temperature changes due to Joule heating by patterned metallic thin films embedded in poly-dimethylsiloxane. The heat conduction within the device and the surrounding normal/cancerous breast tissue is modeled with three-dimensional finite element method (FEM). The FEM simulations are used to explore the potential effects of device geometry and Joule heating on the temperature distribution and lesion (thermal dose). The FEM model is validated using a gel model that mimics biological media. The …
Phase Imaging: Deep Or Superficial?, Nancy Burnham, O Behrend, L Odoni, J Loubet
Phase Imaging: Deep Or Superficial?, Nancy Burnham, O Behrend, L Odoni, J Loubet
Nancy A. Burnham
Phase images acquired while intermittently contacting a sample surface with the tip of an atomic force microscope cantilever are not easy to relate to material properties. We have simulated dynamic force curves and compared simulated with experimental results. For some cantilever–sample combinations, the interaction remains a surface effect, whereas for others, the tip penetrates the sample significantly. Height artifacts in the “topography” images, and the role of the sample stiffness, work of adhesion, damping, and topography in the cantilever response manifest themselves to different extents depending on the indentation depth.
Local Mechanical Spectroscopy With Nanometer-Scale Lateral Resolution, Nancy Burnham, F Oulevey, G Gremaud, A Semoroz, Aj Kulik, E Dupas, D Gourdon
Local Mechanical Spectroscopy With Nanometer-Scale Lateral Resolution, Nancy Burnham, F Oulevey, G Gremaud, A Semoroz, Aj Kulik, E Dupas, D Gourdon
Nancy A. Burnham
A new technique has been developed to probe the viscoelastic and anelastic properties of submicron phases of inhomogeneous materials. The measurement gives information related to the internal friction and to the variations of the dynamic modulus of nanometer-sized volumes. It is then the nanoscale equivalent to mechanical spectroscopy, a well-known macroscopic technique for materials studies, also sometimes called dynamic mechanical (thermal) analysis. The technique is based on a scanning force microscope, using the principle of scanning local-acceleration microscopy (SLAM), and allows the sample temperature to be changed. It is called variable-temperature SLAM, abbreviated T-SLAM. According to a recent proposition to …
Materials’ Properties Measurements: Choosing The Optimal Scanning Probe Microscope Configuration, Nancy Burnham, G Gremaud, A Kulik, P Gallo, F Oulevey
Materials’ Properties Measurements: Choosing The Optimal Scanning Probe Microscope Configuration, Nancy Burnham, G Gremaud, A Kulik, P Gallo, F Oulevey
Nancy A. Burnham
Rheological models are used to represent different scanning probe microscope configurations. The solutions for their static and dynamic behavior are found and used to analyze which scanning probe microscope configuration is best for a given application. We find that modulating the sample at high frequencies results in the best microscope behavior for measuring the stiffness of rigid materials, and that by modulating the tip at low frequencies and detecting the motion of the tip itself (not its position relative to the tip holder) should be best for studying compliant materials in liquids.
Interpretation Issues In Force Microscopy, Nancy Burnham, Richard Colton, Hubert Pollock
Interpretation Issues In Force Microscopy, Nancy Burnham, Richard Colton, Hubert Pollock
Nancy A. Burnham
In this paper, we will discuss force microscopy (FM) and its potential for determining mechanical properties of thin films. We will introduce the basic principles of FM, and demonstrate how FM can be used to determine materials properties as well as image surface topography, both with nanonewton or sub‐nanonewton force resolution and sub‐nanometer position resolution. As FM is still a new field, not all of the questions concerning interpretation have been fully answered. We will elucidate four current issues that must be resolved before the full potential of FM can be realized. They are: (1) the role of water vapor …
Measuring The Nanomechanical Properties And Surface Forces Of Materials Using An Atomic Force Microscope, Nancy Burnham, Richard Colton
Measuring The Nanomechanical Properties And Surface Forces Of Materials Using An Atomic Force Microscope, Nancy Burnham, Richard Colton
Nancy A. Burnham
An atomic force microscope(AFM) has been configured so that it measures the force between a tip mounted on a cantilever beam and a sample surface as a function of the tip–surface separation. This allows the AFM to study both the nanomechanical properties of the sample and the forces associated with the tip–surface interaction. More specifically, the AFM can measure the elastic and plastic behavior and hardness via nanoindentation,van der Waals forces, and the adhesion of thin‐film and bulk materials with unprecedented force and spatial resolution. The force resolution is currently 1 nanonewton, and the depth resolution is 0.02 nm. Additionally, …