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A Cn-Fdtd Scheme And Its Application To Vlsi Interconnects/Substrate Modeling, Rui Qiang, Dagang Wu, Ji Chen, Chen Wang, James L. Drewniak
A Cn-Fdtd Scheme And Its Application To Vlsi Interconnects/Substrate Modeling, Rui Qiang, Dagang Wu, Ji Chen, Chen Wang, James L. Drewniak
James K. Wu, M.D.
In this paper, a two-dimensional (2D) Crank-Nicholason (CN) finite difference time domain (FDTD) method is proposed for VLSI interconnect/substrate characterization. Through rigorous truncation and dispersion error analyses, a guideline on using this technique is presented. Several iterative solvers are investigated to accelerate the solution of the CN-FDTD scheme. Numerical examples are given to demonstrate the accuracy and the efficiency of the proposed algorithm.