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Estimating The Yield Strength Of Thin Metal Films Through Elastic-Plastic Buckling-Induced Debonding, S Goyal, K Srinivasan, G Subbarayan, Thomas Siegmund

School of Mechanical Engineering Faculty Publications

In this paper, we propose a procedure to estimate the yield strength of thin films by debonding films from their substrate by elastic-plastic buckling under thermally-induced compressive loading. The out-of-plane displacement of the metal lines under conditions of elastic-plastic buckling is dependent on the yield strength of the film. Thus, an inverse estimate of the yield strength is made from measurements of the out-of-plane displacements of the buckled metal lines. The procedure is demonstrated to estimate the yield strength of aluminum lines consistent with measurements by other techniques.