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Full-Text Articles in Engineering
Laser As A Tool To Study Radiation Effects In Cmos, Bahar Ajdari
Laser As A Tool To Study Radiation Effects In Cmos, Bahar Ajdari
Dissertations and Theses
Energetic particles from cosmic ray or terrestrial sources can strike sensitive areas of CMOS devices and cause soft errors. Understanding the effects of such interactions is crucial as the device technology advances, and chip reliability has become more important than ever. Particle accelerator testing has been the standard method to characterize the sensitivity of chips to single event upsets (SEUs). However, because of their costs and availability limitations, other techniques have been explored. Pulsed laser has been a successful tool for characterization of SEU behavior, but to this day, laser has not been recognized as a comparable method to beam …
Memcapacitive Devices In Logic And Crossbar Applications, Dat Tran, Christof Teuscher
Memcapacitive Devices In Logic And Crossbar Applications, Dat Tran, Christof Teuscher
Electrical and Computer Engineering Faculty Publications and Presentations
Over the last decade, memristive devices have been widely adopted in computing for various conventional and unconventional applications. While the integration density, memory property, and nonlinear characteristics have many benefits, reducing the energy consumption is limited by the resistive nature of the devices. Memcapacitors would address that limitation while still having all the benefits of memristors. Recent work has shown that with adjusted parameters during the fabrication process, a metal-oxide device can indeed exhibit a memcapacitive behavior. We introduce novel memcapacitive logic gates and memcapacitive crossbar classifiers as a proof of concept that such applications can outperform memristor-based architectures. The …