Engineering Commons^™

Quadded Gasp: A Fault Tolerant Asynchronous Design, Kristopher S. Scheiblauer

Dissertations and Theses

As device scaling continues, process variability and defect densities are becoming increasingly challenging for circuit designers to contend with. Variability reduces timing margins, making it difficult and time consuming to meet design specifications. Defects can cause degraded performance or incorrect operation resulting in circuit failure. Consequently test times are lengthened and production yields are reduced.

This work assess the combination of two concepts, self-timed asynchronous design and fault tolerance, as a possible solution to both variability and defects. Asynchronous design is not as sensitive to variability as synchronous, while fault tolerance allows continued functional operation in the presence of defects. …

A Fault-Tolerant Alternative To Lockstep Triple Modular Redundancy, Andrew Lockett Baldwin

Dissertations and Theses

Semiconductor manufacturing defects adversely affect yield and reliability. Manufacturers expend vast resources to reduce defects within their processes. As the minimum feature size get smaller, defects become increasingly difficult to prevent. Defects can change the behavior of a logic circuit resulting in a fault. Manufacturers and designers may improve yield, reliability, and profitability by using design techniques that make products robust even in the presence of faults. Triple modular redundancy (TMR) is a fault tolerant technique commonly used to mask faults using voting outcomes from three processing elements (PE). TMR is effective at masking errors as long as no more …