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De-Embedding Method Comparisons And Physics Based Circuit Model For High Frequency D-Probe, Yuan Chen
De-Embedding Method Comparisons And Physics Based Circuit Model For High Frequency D-Probe, Yuan Chen
Masters Theses
"In section 1, the procedures of 1X-Reflect smart fixture de-embedding (SFD), 1-port auto fixture removal (AFR), and 2X-Thru SFD are compared from various perspectives: test fixture design, the de-embedding procedure, and de-embedded results. The accuracy of fixture characterization and the de-embedded result is the key figure of merit (FOM) in each de-embedding method. Full wave models are built to evaluate the FOM of the three methods, by comparing the scattering parameters (S-parameters) and time domain reflectometer (TDR). A test coupon for measuring USB-C cables is adopted to serve as a manufactured validation purpose.
In section 2, a physics-based circuit model …