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Missouri University of Science and Technology
<p>Integrated circuits -- Protection<br />Electric discharges<br />Electrostatics<br />Electronic circuits -- Noise -- Detection<br />Electromagnetic compatibility</p>
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Characterization Of An Integrated Circuit With Respect To Electrostatic Discharge-Induced Soft Failures, Benjamin J. Orr
Characterization Of An Integrated Circuit With Respect To Electrostatic Discharge-Induced Soft Failures, Benjamin J. Orr
Doctoral Dissertations
"This research proposal presents a methodology whereby an integrated circuit (IC) can be characterized with respect to soft-failures induced by Electrostatic Discharge (ESD)-like events. This methodology uses an exclusively "black-box" approach to determine the response of an IC in a system-level environment, thereby allowing it to be implemented without intimate knowledge of the DUT IC. Results from this methodology can be referenced during system design to raise awareness of specific vulnerabilities of the core system ICs.
During work on this methodology, several sub topics have been explored and developed in the field of system-level ESD. Sections 2 and 3 introduce …