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Articles 1 - 5 of 5
Full-Text Articles in Engineering
Dynamic Companion Harmonic Circuit Models For Analysis Of Power Systems With Embedded Power Electronics Devices, H. Garcia, M. Madrigal, B. Vyakaranam, Rick Rarick, F. Eugenio Villaseca
Dynamic Companion Harmonic Circuit Models For Analysis Of Power Systems With Embedded Power Electronics Devices, H. Garcia, M. Madrigal, B. Vyakaranam, Rick Rarick, F. Eugenio Villaseca
F. Eugenio Villaseca
In this paper a methodology that extends the dynamic harmonic domain (DHD) analysis of large networks is presented. The method combines DHD analysis and discrete companion circuit modeling resulting in a powerful analytic technique called dynamic companion harmonic circuit modeling. It provides for a complete dynamic harmonic analysis of the system while preserving the advantages of discrete companion circuit models. The methodology is illustrated by its application to a three-node power system, where reactive power compensation is achieved using a fixed-capacitor, thyristor-controlled reactor (FC-TCR) and its control system.
Low-Cost Stereo Vision On An Fpga, Chris A. Murphy, Daniel Lindquist, Ann Marie Rynning, Thomas Cecil, Sarah Leavitt, Mark L. Chang
Low-Cost Stereo Vision On An Fpga, Chris A. Murphy, Daniel Lindquist, Ann Marie Rynning, Thomas Cecil, Sarah Leavitt, Mark L. Chang
Mark L. Chang
We present a low-cost stereo vision implementation suitable for use in autonomous vehicle applications and designed with agricultural applications in mind. This implementation utilizes the Census transform algorithm to calculate depth maps from a stereo pair of automotive-grade CMOS cameras. The final prototype utilizes commodity hardware, including a Xilinx Spartan-3 FPGA, to process 320times240 pixel images at greater than 150 frames per second and deliver them via a USB 2.0 interface.
Evaluation And Design Optimization Of Piezoresistive Gauge Factor Of Thick-Film Resistors, Sherra E. Kerns, David V. Kerns, C Song, J. L. Davidson, W. P. Kang
Evaluation And Design Optimization Of Piezoresistive Gauge Factor Of Thick-Film Resistors, Sherra E. Kerns, David V. Kerns, C Song, J. L. Davidson, W. P. Kang
Sherra E. Kerns
On the basis of the analysis of all the thick- film design methodologies, the authors designed a test sample on which four different length-over-width ratios of resistors were designed. They found that the length-over-width ratio will substantially affect the gauge factor in some cases, in contrast to prior research. This can be modeled to generate a linear predictive model, The sensors designed on the insulator and the sensors underneath the insulator were also studied in order to simulate the multilayer hybrid technology and study the effects of insulator-resistor-substrate surface interaction. It is demonstrated that design techniques can affect the strain …
Measurement Of Metal Migration On Thick Film Piezoresistors And Their Termination, David V. Kerns, C Song, J L. Davidson, D L. Kinser
Measurement Of Metal Migration On Thick Film Piezoresistors And Their Termination, David V. Kerns, C Song, J L. Davidson, D L. Kinser
David V. Kerns
Metal migration from the thick-film termination can affect not only the electrical characteristics but also the gauge factor or piezoresistive coefficient of thick-film sensors. Four sets of sensors with different ratios were designed to test the influence of the terminal metal migration effects on the gauge factors and resistivity of thick-film resistors. In all the cases, the shortest resistors have a lower gauge factor and a large deviation ofresistances. The longer resistors will have better electrical parameters. SEM (scanning electron microscope) studies showed this interaction at the interface between the terminal and the resistor. The same distance of terminal diffusion …
Evaluation And Design Optimization Of Piezoresistive Gauge Factor Of Thick-Film Resistors, Sherra E. Kerns, David V. Kerns, C Song, J. L. Davidson, W. P. Kang
Evaluation And Design Optimization Of Piezoresistive Gauge Factor Of Thick-Film Resistors, Sherra E. Kerns, David V. Kerns, C Song, J. L. Davidson, W. P. Kang
David V. Kerns
On the basis of the analysis of all the thick- film design methodologies, the authors designed a test sample on which four different length-over-width ratios of resistors were designed. They found that the length-over-width ratio will substantially affect the gauge factor in some cases, in contrast to prior research. This can be modeled to generate a linear predictive model, The sensors designed on the insulator and the sensors underneath the insulator were also studied in order to simulate the multilayer hybrid technology and study the effects of insulator-resistor-substrate surface interaction. It is demonstrated that design techniques can affect the strain …