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Full-Text Articles in Engineering
Evaluation Of Strain Distortion Correction Protocol Using Scanning Electron Microscopy And Digital Image Correlation, Alexandra Mallory, Alberto Mello, Michael Sangid
Evaluation Of Strain Distortion Correction Protocol Using Scanning Electron Microscopy And Digital Image Correlation, Alexandra Mallory, Alberto Mello, Michael Sangid
The Summer Undergraduate Research Fellowship (SURF) Symposium
Scanning electron microscopy in combination with digital image correlation (SEM-DIC) is a useful technique for measuring strain in materials at the micro-scale. In particular, it can be used to identify micro-scale strain localizations that are the precursor to material failure. While SEM produces high resolution images of the microstructure, the images also contain a large amount of distortion that, during DIC, will result in distorted strain values that require correction. In this project, a nickel-based alloy underwent cyclic mechanical fatigue at three different high temperatures to a targeted maximum strain. Scanning electron microscopy imaging was done on a 200x150μm area …
Metamodels Of Residual Stress Buildup For Machining Process Modeling, Stuart B. Mccrorie, Michael Sangid
Metamodels Of Residual Stress Buildup For Machining Process Modeling, Stuart B. Mccrorie, Michael Sangid
The Summer Undergraduate Research Fellowship (SURF) Symposium
In the process of machining materials, stresses, called residual stresses, accumulate in the workpiece being machined that remain after the process is completed. These residual stresses can affect the properties of the material or cause part distortion, and it is important that they be calculated to prevent complications from arising due to the residual stresses. However, these calculations can be incredibly computationally intensive, and thus other methods are needed to predict the residual stresses in materials for quick decision-making during machining. By using metamodels - a method of representing data where few data points exist - we can achieve an …